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Journal: Journal of Low Power Electronics and ApplicationsVolume: 9Number: 19
Article: ILP Based Power-Aware Test Time Reduction Using On-Chip Clocking in NoC Based SoC
  • Authors:
  • Harikrishna Parmar and
  • Usha Mehta*
Link: https://www.mdpi.com/2079-9268/9/2/19

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