Florovič, M.; Kováč, J., Jr.; Chvála, A.; Kováč, J.; Jacquet, J.-C.; Delage, S.L.
Theoretical and Experimental Substractions of Device Temperature Determination Utilizing I-V Characterization Applied on AlGaN/GaN HEMT. Electronics 2021, 10, 2738.
https://doi.org/10.3390/electronics10222738
AMA Style
Florovič M, Kováč J Jr., Chvála A, Kováč J, Jacquet J-C, Delage SL.
Theoretical and Experimental Substractions of Device Temperature Determination Utilizing I-V Characterization Applied on AlGaN/GaN HEMT. Electronics. 2021; 10(22):2738.
https://doi.org/10.3390/electronics10222738
Chicago/Turabian Style
Florovič, Martin, Jaroslav Kováč, Jr., Aleš Chvála, Jaroslav Kováč, Jean-Claude Jacquet, and Sylvain Laurent Delage.
2021. "Theoretical and Experimental Substractions of Device Temperature Determination Utilizing I-V Characterization Applied on AlGaN/GaN HEMT" Electronics 10, no. 22: 2738.
https://doi.org/10.3390/electronics10222738
APA Style
Florovič, M., Kováč, J., Jr., Chvála, A., Kováč, J., Jacquet, J. -C., & Delage, S. L.
(2021). Theoretical and Experimental Substractions of Device Temperature Determination Utilizing I-V Characterization Applied on AlGaN/GaN HEMT. Electronics, 10(22), 2738.
https://doi.org/10.3390/electronics10222738
