Next Article in Journal
Radiation-Tolerant All-Digital PLL/CDR with Varactorless LC DCO in 65 nm CMOS
Next Article in Special Issue
Lexicon-Based vs. Bert-Based Sentiment Analysis: A Comparative Study in Italian
Previous Article in Journal
Theoretical and Experimental Substractions of Device Temperature Determination Utilizing I-V Characterization Applied on AlGaN/GaN HEMT
Previous Article in Special Issue
Explainable Sentiment Analysis: A Hierarchical Transformer-Based Extractive Summarization Approach
 
 
Article

Article Versions Notes

Electronics 2021, 10(22), 2739; https://doi.org/10.3390/electronics10222739
Action Date Notes Link
article xml file uploaded 10 November 2021 10:16 CET Original file -
article xml uploaded. 10 November 2021 10:16 CET Update https://www.mdpi.com/2079-9292/10/22/2739/xml
article pdf uploaded. 10 November 2021 10:16 CET Version of Record https://www.mdpi.com/2079-9292/10/22/2739/pdf
article html file updated 10 November 2021 10:17 CET Original file -
article html file updated 30 July 2022 15:49 CEST Update https://www.mdpi.com/2079-9292/10/22/2739/html
Back to TopTop