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Journal: Electronics, 2021
Volume: 10
Number: 858

Article: Applications of Direct-Current Current–Voltage Method to Total Ionizing Dose Radiation Characterization in SOI NMOSFETs with Different Process Conditions
Authors: by Yangyang Li, Chuanbin Zeng, Xiaojing Li, Linchun Gao, Weiwei Yan, Duoli Li, Yi Zhang, Zhengsheng Han and Jiajun Luo
Link: https://www.mdpi.com/2079-9292/10/7/858

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