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Journal: Electronics, 2022
Volume: 11
Number: 3198

Article: A Novel Autocorrelation Combined MM-CDR Time-Interleaved ADC Timing Calibration in 28 nm CMOS Technology
Authors: by Youzhi Gu, Xinjie Feng, Runze Chi, Jiangfeng Wu and Yongzhen Chen
Link: https://www.mdpi.com/2079-9292/11/19/3198

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