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Journal: Electronics, 2022
Volume: 11
Number: 583
Article:
Simplistic, Efficient, and Low-Cost Crack Detection of Dielectric Materials Based on Millimeter-Wave Interference
Authors:
by
Liangping Chen, Liangjie Bi, Yong Yin, Yu Qin, Minsheng Song, Bin Wang, Hailong Li and Lin Meng
Link:
https://www.mdpi.com/2079-9292/11/4/583
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