Next Article in Journal
Insu-YOLO: An Insulator Defect Detection Algorithm Based on Multiscale Feature Fusion
Next Article in Special Issue
Low-Power Single Bitline Load Sense Amplifier for DRAM
Previous Article in Journal
Risevi: A Disease Risk Prediction Model Based on Vision Transformer Applied to Nursing Homes
Previous Article in Special Issue
A Three-Step Tapered Bit Period SAR ADC Using Area-Efficient Clock Generation
 
 
Article

Article Versions Notes

Electronics 2023, 12(15), 3209; https://doi.org/10.3390/electronics12153209
Action Date Notes Link
article xml file uploaded 25 July 2023 08:09 CEST Original file -
article xml uploaded. 25 July 2023 08:09 CEST Update https://www.mdpi.com/2079-9292/12/15/3209/xml
article pdf uploaded. 25 July 2023 08:09 CEST Version of Record https://www.mdpi.com/2079-9292/12/15/3209/pdf
article html file updated 25 July 2023 08:11 CEST Original file -
article html file updated 25 July 2023 08:12 CEST Update -
article html file updated 25 July 2023 08:15 CEST Update -
article html file updated 6 August 2023 21:50 CEST Update https://www.mdpi.com/2079-9292/12/15/3209/html
Back to TopTop