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Journal: Electronics, 2023
Volume: 12
Number: 3210

Article: Insu-YOLO: An Insulator Defect Detection Algorithm Based on Multiscale Feature Fusion
Authors: by Yifu Chen, Hongye Liu, Jiahao Chen, Jianhong Hu and Enhui Zheng
Link: https://www.mdpi.com/2079-9292/12/15/3210

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