Next Article in Journal
Survey on Application of Trusted Computing in Industrial Control Systems
Next Article in Special Issue
Recovery Effect of Hot-Carrier Stress on γ-ray-Irradiated 0.13 μm Partially Depleted SOI n-MOSFETs
Previous Article in Journal
RepRCNN: A Structural Reparameterisation Convolutional Neural Network Object Detection Algorithm Based on Branch Matching
Previous Article in Special Issue
Research on High-Dose-Rate Transient Ionizing Radiation Effect in Nano-Scale FDSOI Flip-Flops
 
 
Article

Article Versions Notes

Electronics 2023, 12(19), 4181; https://doi.org/10.3390/electronics12194181
Action Date Notes Link
article xml file uploaded 9 October 2023 10:28 CEST Original file -
article xml uploaded. 9 October 2023 10:28 CEST Update https://www.mdpi.com/2079-9292/12/19/4181/xml
article pdf uploaded. 9 October 2023 10:28 CEST Version of Record https://www.mdpi.com/2079-9292/12/19/4181/pdf
article html file updated 9 October 2023 10:29 CEST Original file https://www.mdpi.com/2079-9292/12/19/4181/html
Back to TopTop