Next Article in Journal
Fluorine-Based Low-Damage Selective Etching Process for E-Mode p-GaN/AlGaN/GaN HFET Fabrication
Next Article in Special Issue
Efficient X-ray Security Images for Dangerous Goods Detection Based on Improved YOLOv7
Previous Article in Journal
Combining MUSHRA Test and Fuzzy Logic in the Evaluation of Benefits of Using Hearing Prostheses
Previous Article in Special Issue
Enhancing Image Clarity: A Non-Local Self-Similarity Prior Approach for a Robust Dehazing Algorithm
 
 
Article

Article Versions Notes

Electronics 2023, 12(20), 4346; https://doi.org/10.3390/electronics12204346
Action Date Notes Link
article pdf uploaded. 19 October 2023 17:35 CEST Version of Record https://www.mdpi.com/2079-9292/12/20/4346/pdf-vor
article xml file uploaded 20 October 2023 08:48 CEST Original file -
article xml uploaded. 20 October 2023 08:48 CEST Update https://www.mdpi.com/2079-9292/12/20/4346/xml
article pdf uploaded. 20 October 2023 08:48 CEST Updated version of record https://www.mdpi.com/2079-9292/12/20/4346/pdf
article html file updated 20 October 2023 08:49 CEST Original file https://www.mdpi.com/2079-9292/12/20/4346/html
Back to TopTop