Next Article in Journal
Frequent Power-Up-and-Down-Induced Degradation of Device and Bandgap Voltage Reference in 14-nm FinFET Technology
Previous Article in Journal
A Scalable Multi-FPGA Platform for Hybrid Intelligent Optimization Algorithms
 
 
Correction

Article Versions Notes

Electronics 2024, 13(17), 3505; https://doi.org/10.3390/electronics13173505
Action Date Notes Link
article xml file uploaded 4 September 2024 04:02 CEST Original file -
article xml uploaded. 4 September 2024 04:02 CEST Update https://www.mdpi.com/2079-9292/13/17/3505/xml
article pdf uploaded. 4 September 2024 04:02 CEST Version of Record https://www.mdpi.com/2079-9292/13/17/3505/pdf
article html file updated 4 September 2024 04:04 CEST Original file https://www.mdpi.com/2079-9292/13/17/3505/html
Back to TopTop