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Journal: Electronics, 2024
Volume: 13
Number: 303

Article: Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs
Authors: by Paolo Bernardi, Augusto Maria Guerriero, Giorgio Insinga, Giovanni Paganini, Giambattista Carnevale, Matteo Coppetta, Walter Mischo and Rudolf Ullmann
Link: https://www.mdpi.com/2079-9292/13/2/303

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