Next Article in Journal
Tea Harvest Robot Navigation Path Generation Algorithm Based on Semantic Segmentation Using a Visual Sensor
Previous Article in Journal
MNv3-MFAE: A Lightweight Network for Video Action Recognition
 
 
Font Type:
Arial Georgia Verdana
Font Size:
Aa Aa Aa
Line Spacing:
Column Width:
Background:
This is an early access version, the complete PDF, HTML, and XML versions will be available soon.
Article

A Real-Time Diagnosis Method of Open-Circuit Faults in Cascaded H-Bridge Rectifiers Based on Voltage Threshold and Current Coefficient of Variation

1
School of Automation and Electrical Engineering, Zhongyuan University of Technology, Zhengzhou 451191, China
2
State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China
3
School of Computer Science, Zhongyuan University of Technology, Zhengzhou 451191, China
4
Training Center, State Grid Ningxia Electric Power Co., Ltd., Yinchuan 750002, China
*
Author to whom correspondence should be addressed.
Electronics 2025, 14(5), 986; https://doi.org/10.3390/electronics14050986
Submission received: 3 December 2024 / Revised: 27 February 2025 / Accepted: 27 February 2025 / Published: 28 February 2025
(This article belongs to the Section Industrial Electronics)

Abstract

To effectively diagnose open-circuit (OC) faults in the insulated gate bipolar transistor (IGBT) of a cascaded H-bridge rectifier (CHBR) in real-time, this paper uses a single-phase three-cell CHBR as an example. Through mechanism analysis, the variation patterns of the capacitor voltage and grid current due to OC faults are defined. Based on this, the DC capacitor voltage threshold (VT) and the grid current coefficient of variation (CCV) are introduced as fault diagnosis indices, and a real-time OC fault diagnosis method for CHBR is established. The robustness, accuracy, timeliness, and universality of the proposed method are validated through simulations. The results show that the proposed method exhibits strong robustness when the grid voltage fluctuates, either dropping from 3 kV to 2.85 kV or rising from 3 kV to 3.15 kV. Compared to existing diagnostic methods, the proposed approach requires less diagnostic time, with the faulty IGBT being identified in as little as 3.09 ms under optimal conditions. Additionally, the diagnostic performance remains unaffected by changes in control strategies, making it universally applicable for OC fault diagnosis in CHBR under various control strategies (such as dq current decoupling control, PR current control, and transient current control), with comparable diagnosis results and speeds.
Keywords: cascaded H-bridge rectifier; open-circuit fault; IGBT; universality; real-time fault diagnosis cascaded H-bridge rectifier; open-circuit fault; IGBT; universality; real-time fault diagnosis

Share and Cite

MDPI and ACS Style

Liu, Y.; Guo, Z.; Liu, F.; Guo, F.; Wang, K.; Zhu, Y.; Hou, F.; Wang, X. A Real-Time Diagnosis Method of Open-Circuit Faults in Cascaded H-Bridge Rectifiers Based on Voltage Threshold and Current Coefficient of Variation. Electronics 2025, 14, 986. https://doi.org/10.3390/electronics14050986

AMA Style

Liu Y, Guo Z, Liu F, Guo F, Wang K, Zhu Y, Hou F, Wang X. A Real-Time Diagnosis Method of Open-Circuit Faults in Cascaded H-Bridge Rectifiers Based on Voltage Threshold and Current Coefficient of Variation. Electronics. 2025; 14(5):986. https://doi.org/10.3390/electronics14050986

Chicago/Turabian Style

Liu, Yong, Zhe Guo, Fei Liu, Feiya Guo, Kang Wang, Yongsheng Zhu, Feng Hou, and Xiaolei Wang. 2025. "A Real-Time Diagnosis Method of Open-Circuit Faults in Cascaded H-Bridge Rectifiers Based on Voltage Threshold and Current Coefficient of Variation" Electronics 14, no. 5: 986. https://doi.org/10.3390/electronics14050986

APA Style

Liu, Y., Guo, Z., Liu, F., Guo, F., Wang, K., Zhu, Y., Hou, F., & Wang, X. (2025). A Real-Time Diagnosis Method of Open-Circuit Faults in Cascaded H-Bridge Rectifiers Based on Voltage Threshold and Current Coefficient of Variation. Electronics, 14(5), 986. https://doi.org/10.3390/electronics14050986

Note that from the first issue of 2016, this journal uses article numbers instead of page numbers. See further details here.

Article Metrics

Back to TopTop