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Journal: Electronics, 2025
Volume: 14
Number: 1743

Article: A Critical Review of Techniques for the Experimental Extraction of the Thermal Resistance of Bipolar Transistors from DC Measurements—Part II: Approaches Based on Intersection Points
Authors: by Vincenzo d’Alessandro, Antonio Pio Catalano and Ciro Scognamillo
Link: https://www.mdpi.com/2079-9292/14/9/1743

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