Fast Imaging of Short Perfectly Conducting Cracks in Limited-Aperture Inverse Scattering Problem
Abstract
:1. Introduction
2. Direct Scattering Problem and Far-Field Pattern
3. Single-Frequency Subspace Migration in Limited-Aperture Problem: Introduction, Analysis, and Numerical Simulations
3.1. Introduction to Imaging Function of Subspace Migration
Algorithm 1 Procedure of imaging via subspace migration at given wavenumber k. | |
1: procedure Subspace migration(k) | |
2: Initialize | |
3: for to M do | |
4: for to N do | |
5: collect far-field data | ▹ see (3) |
6: end for | |
7: end for | |
8: perform SVD of | ▹ see (5) |
9: select and | ▹ see (6) |
10: for do | |
11: evaluate and | ▹ see (7) |
12: initialize | |
13: for to S do | |
14: | |
15: end for | |
16: | |
17: end for | |
18: plot | |
19: end procedure |
3.2. Analysis of Imaging Function
- 1.
- As and for all , we can examine that when for all s. This means that the terms and does not contribute to the imaging of cracks. Furthermore, due to the oscillating properties of Bessel functions, some artifacts will be appear in the map of .
- 2.
- The imaging performance of is significantly depending on the range of incident and observation directions. For a detail, if the range of incident or observations is narrow, i.e., if the value of either or is small, it will be very hard to recognize the location of because the term , which contributes to the imaging of cracks, is dominate by either or . Otherwise, if the range of both incident and observation directions is wide, it will be possible to obtain good results.
- 3.
- Based on the above observation, eliminating the terms and will be a method of improvement of imaging performance. Notice that since the secrackhing point is arbitrary, it is impossible to make . This means that one must find a condition to satisfy
- 4.
- As the following asymptotic property holds for sufficiently large k
- 5.
- In the limited-view problem, i.e., if for with then since , can be expressed as
- 6.
- In the full-aperture problem, i.e., if then since , can be expressed as
4. Simulation Results
4.1. Imaging of Well-Separated Small Cracks
4.2. Imaging of Closely Located Small Cracks: Resolution Limit
4.3. Further Results: Imaging of Cracks with Neumann Boundary Condition
5. Conclusions
Funding
Conflicts of Interest
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Setting 1 | Setting 2 | Setting 3 | Setting 4 | Setting 5 | Setting 6 | |
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0 | ||||||
M | 7 | 11 | 14 | 21 | 31 | 41 |
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Park, W.-K. Fast Imaging of Short Perfectly Conducting Cracks in Limited-Aperture Inverse Scattering Problem. Electronics 2019, 8, 1050. https://doi.org/10.3390/electronics8091050
Park W-K. Fast Imaging of Short Perfectly Conducting Cracks in Limited-Aperture Inverse Scattering Problem. Electronics. 2019; 8(9):1050. https://doi.org/10.3390/electronics8091050
Chicago/Turabian StylePark, Won-Kwang. 2019. "Fast Imaging of Short Perfectly Conducting Cracks in Limited-Aperture Inverse Scattering Problem" Electronics 8, no. 9: 1050. https://doi.org/10.3390/electronics8091050
APA StylePark, W. -K. (2019). Fast Imaging of Short Perfectly Conducting Cracks in Limited-Aperture Inverse Scattering Problem. Electronics, 8(9), 1050. https://doi.org/10.3390/electronics8091050