Next Article in Journal
High-Voltage Temperature Humidity Bias Test (HV-THB): Overview of Current Test Methodologies and Reliability Performances
Previous Article in Journal
Emulator of a Boost Converter for Educational Purposes
 
 
Article

Article Versions Notes

Electronics 2020, 9(11), 1881; https://doi.org/10.3390/electronics9111881
Action Date Notes Link
article pdf uploaded. 9 November 2020 12:59 CET Version of Record https://www.mdpi.com/2079-9292/9/11/1881/pdf-vor
article xml file uploaded 10 November 2020 11:37 CET Original file -
article xml uploaded. 10 November 2020 11:37 CET Update https://www.mdpi.com/2079-9292/9/11/1881/xml
article pdf uploaded. 10 November 2020 11:37 CET Updated version of record https://www.mdpi.com/2079-9292/9/11/1881/pdf
article html file updated 10 November 2020 11:38 CET Original file -
article html file updated 23 July 2022 00:21 CEST Update https://www.mdpi.com/2079-9292/9/11/1881/html
Back to TopTop