Figure 1.
Distribution error with the values of p and q norms for the 500 nm unimodal particles.
Figure 1.
Distribution error with the values of p and q norms for the 500 nm unimodal particles.
Figure 2.
Inversion PSD of Lp,q model when p takes different values, q takes 1, 2, 50, 100, 500, and ∞, respectively. (a) p = 1, (b) p = 2, (c) p = 50, (d) p = 100, (e) p = 500, and (f) p = ∞.
Figure 2.
Inversion PSD of Lp,q model when p takes different values, q takes 1, 2, 50, 100, 500, and ∞, respectively. (a) p = 1, (b) p = 2, (c) p = 50, (d) p = 100, (e) p = 500, and (f) p = ∞.
Figure 3.
Distribution error with the values of p and q norms for the 200/500 nm bimodal particles.
Figure 3.
Distribution error with the values of p and q norms for the 200/500 nm bimodal particles.
Figure 4.
Inversion PSD of Lp,q model when p takes different values, q takes 1, 2, 50, 100, 500, and ∞, respectively (a) p = 1, (b) p = 2, (c) p = 50, (d) p = 100, (e) p = 500, (f) p = ∞.
Figure 4.
Inversion PSD of Lp,q model when p takes different values, q takes 1, 2, 50, 100, 500, and ∞, respectively (a) p = 1, (b) p = 2, (c) p = 50, (d) p = 100, (e) p = 500, (f) p = ∞.
Figure 5.
The basic flow chart of L1,∞ constrained regularization method.
Figure 5.
The basic flow chart of L1,∞ constrained regularization method.
Figure 6.
PSD of 650 nm unimodal particles inverted by L2,2, L1,∞, L1,2, and L2,∞ models at various noise levels. (a) 0.0001, (b) 0.0005, (c) 0.001, and (d) 0.005.
Figure 6.
PSD of 650 nm unimodal particles inverted by L2,2, L1,∞, L1,2, and L2,∞ models at various noise levels. (a) 0.0001, (b) 0.0005, (c) 0.001, and (d) 0.005.
Figure 7.
PSD of 200nm/500 nm close-distributed bimodal particles inverted by L2,2, L1,∞, L1,2, and L2,∞ models at different noise levels. (a) 0.0001, (b) 0.0005, (c) 0.001, and (d) 0.005.
Figure 7.
PSD of 200nm/500 nm close-distributed bimodal particles inverted by L2,2, L1,∞, L1,2, and L2,∞ models at different noise levels. (a) 0.0001, (b) 0.0005, (c) 0.001, and (d) 0.005.
Figure 8.
PSD of 200 nm/800 nm far-distributed bimodal particles inverted by L2,2, L1,∞, L1,2, and L2,∞ models at various noise levels. (a) 0.0001, (b) 0.0005, (c) 0.001, and (d) 0.005.
Figure 8.
PSD of 200 nm/800 nm far-distributed bimodal particles inverted by L2,2, L1,∞, L1,2, and L2,∞ models at various noise levels. (a) 0.0001, (b) 0.0005, (c) 0.001, and (d) 0.005.
Figure 9.
Inversion results for bimodal and unimodal particles of L2,2, L1,∞, L1,2, and L2,∞. (a) 33 nm; (b) 58 nm; (c) 33 nm/203 nm.
Figure 9.
Inversion results for bimodal and unimodal particles of L2,2, L1,∞, L1,2, and L2,∞. (a) 33 nm; (b) 58 nm; (c) 33 nm/203 nm.
Figure 10.
Inversion results for bimodal and unimodal particles of L-contin and L1,∞. (a) 58 nm; (b) 33 nm/203 nm.
Figure 10.
Inversion results for bimodal and unimodal particles of L-contin and L1,∞. (a) 58 nm; (b) 33 nm/203 nm.
Table 1.
Parameters for simulation data of unimodal and bimodal particles.
Table 1.
Parameters for simulation data of unimodal and bimodal particles.
Particles | Parameters |
---|
Dmin/nm | Dmax/nm | Ra1 | σ1 | Ra2 | σ2 |
---|
500 nm | 0 | 1000 | 1 | 0.2 | 0 | - |
200 nm/500 nm | 0 | 1000 | 0.6 | 0.06 | 0.4 | 0.1 |
Table 2.
Distribution errors of the 500 nm unimodal particles for some values of p and q norms.
Table 2.
Distribution errors of the 500 nm unimodal particles for some values of p and q norms.
E | q = 1 | q = 2 | q = 50 | q = 100 | q = 500 | q = ∞ |
---|
p = 1 | 0.2426 | 0.1970 | 0.1970 | 0.1968 | 0.1966 | 0.1866 |
p = 2 | 0.8179 | 0.8181 | 0.8175 | 0.8132 | 0.8168 | 0.8140 |
p = 50 | 0.8362 | 0.8347 | 0.8364 | 0.8257 | 0.8258 | 0.8257 |
p = 100 | 0.8573 | 0.8555 | 0.8830 | 0.8832 | 0.8834 | 0.8834 |
p = 500 | 0.8948 | 0.8880 | 0.8798 | 0.8736 | 0.8805 | 0.8804 |
Table 3.
Distribution errors of the 200/500 nm bimodal particles for some values of p and q norms.
Table 3.
Distribution errors of the 200/500 nm bimodal particles for some values of p and q norms.
E | q = 1 | q = 2 | q = 50 | q = 100 | q = 500 | q = ∞ |
---|
p = 1 | 0.5852 | 0.5677 | 0.5321 | 0.5314 | 0.5313 | 0.5311 |
p = 2 | 0.8940 | 0.8576 | 0.8850 | 0.8821 | 0.8815 | 0.8832 |
p = 50 | 0.9068 | 0.9233 | 0.9576 | 0.9596 | 0.9695 | 0.9605 |
p = 100 | 0.9348 | 0.9668 | 0.9845 | 0.9846 | 0.9863 | 0.9844 |
p = 500 | 0.9226 | 0.9703 | 0.9844 | 0.9842 | 0.9841 | 0.9841 |
Table 4.
Simulation parameters for unimodal and bimodal particle data.
Table 4.
Simulation parameters for unimodal and bimodal particle data.
Sample | Di/nm | Ra1 | D1g/nm | σ1 | Ra2 | D2g/nm | σ2 |
---|
S1 | 200~1000 | 1 | 650 | 0.12 | 0 | — | — |
S2 | 0~900 | 0.6 | 200 | 0.1 | 0.4 | 500 | 0.1 |
S3 | 0~1000 | 0.5 | 200 | 0.2 | 0.5 | 800 | 0.07 |
Table 5.
Data on peak errors and distribution errors of 650 nm unimodal particles inverted by L2,2, L1,∞, L1,2, and L2,∞ models across varying noise levels.
Table 5.
Data on peak errors and distribution errors of 650 nm unimodal particles inverted by L2,2, L1,∞, L1,2, and L2,∞ models across varying noise levels.
Noise | L2,2 | L1,∞ | L1,2 | L2,∞ |
---|
EPV/% | E | EPV/% | E | EPV/% | E | EPV/% | E |
---|
0.0001 | 1.59 | 0.1133 | 1.59 | 0.0983 | 3.17 | 0.1091 | 1.59 | 0.1369 |
0.0005 | 1.59 | 0.3299 | 1.59 | 0.0915 | 1.59 | 0.1743 | 1.59 | 0.1526 |
0.001 | 1.59 | 0.4045 | 0 | 0.0998 | 0 | 0.1069 | 1.59 | 0.2595 |
0.005 | 3.17 | 0.4425 | 0 | 0.1767 | 0 | 0.2924 | 3.17 | 0.2431 |
Table 6.
Peak error and distribution error data of 200nm/500 nm close-distributed bimodal particles inverted by L2,2, L1,∞, L1,2, and L2,∞ models at different noise levels.
Table 6.
Peak error and distribution error data of 200nm/500 nm close-distributed bimodal particles inverted by L2,2, L1,∞, L1,2, and L2,∞ models at different noise levels.
Noise | L2,2 | L1,∞ | L1,2 | L2,∞ |
---|
EPV/% | E | EPV/% | E | EPV/% | E | EPV/% | E |
---|
0.0001 | 10.53/14.29 | 0.7037 | 0/0 | 0.4060 | 5.26/2.04 | 0.4546 | 10.53/10.20 | 0.6764 |
0.0005 | 13.99/20.41 | 0.9235 | 5.26/0 | 0.5181 | 10.53/6.21 | 0.6448 | 13.99/18.37 | 0.9248 |
0.001 | 15.66/22.45 | 0.9633 | 5.26/8.16 | 0.6031 | 10.53/18.37 | 0.7412 | 15.66/22.45 | 0.9633 |
0.005 | 18.43/30.61 | 0.8536 | 5.26/4.08 | 0.5596 | 10.53/8.16 | 0.6883 | 18.43/30.61 | 0.8764 |
Table 7.
Peak error and distribution error data of 200 nm/800 nm far-distributed bimodal particles inverted by L2,2, L1,∞, L1,2, and L2,∞ models at various noise levels.
Table 7.
Peak error and distribution error data of 200 nm/800 nm far-distributed bimodal particles inverted by L2,2, L1,∞, L1,2, and L2,∞ models at various noise levels.
Noise | L2,2 | L1,∞ | L1,2 | L2,∞ |
---|
EPV/% | E | EPV/% | E | EPV/% | E | EPV/% | E |
---|
0.0001 | 5.56/3.80 | 0.5506 | 5.56//1.27 | 0.2210 | 5.56/2.53 | 0.2303 | 5.56/6.33 | 0.4564 |
0.0005 | 5.56/4.27 | 0.2592 | 5.56/1.27 | 0.2303 | 5.56/2.53 | 0.3780 | 5.56/8.22 | 0.4835 |
0.001 | 11.11/8.86 | 0.6078 | 5.56/6.33 | 0.2932 | 5.56/6.33 | 0.3973 | 11.11/8.86 | 0.5169 |
0.005 | 8.22/15.19 | 0.7465 | 5.56/3.80 | 0.2171 | 5.56/3.80 | 0.3255 | 8.22/16.46 | 0.6205 |
Table 8.
Peak values and error figures for bimodal and unimodal particles processed through L2,2, L1,∞, L1,2, and L2,∞ models.
Table 8.
Peak values and error figures for bimodal and unimodal particles processed through L2,2, L1,∞, L1,2, and L2,∞ models.
Particles | 33 nm | 58 nm | 33 nm/203 nm |
---|
Peak Value Position/nm | EPV/% | Peak Value Position/nm | EPV/% | Peak Value Position/nm | EPV/% |
---|
L2,2 | 33 | 0 | 57 | 1.72 | 37/215 | 12.12/5.91 |
L1,∞ | 33 | 0 | 59 | 1.72 | 33/209 | 0/2.96 |
L1,2 | 31 | 6.06 | 61 | 5.17 | 35/217 | 6.06/6.90 |
L2,∞ | 33 | 0 | 57 | 1.72 | 29/193 | 12.12/4.93 |
Table 9.
Peak values and error figures for bimodal and unimodal particles processed through L-contin and L1,∞ model.
Table 9.
Peak values and error figures for bimodal and unimodal particles processed through L-contin and L1,∞ model.
Particles | 58 nm | 33 nm/203 nm |
---|
Peak Value Position/nm | EPV/% | Peak Value Position/nm | EPV/% |
---|
L-conttin | 57 | 3.49 | 34/216 | 3.03/6.40 |
L1,∞ | 60 | 1.72 | 33/209 | 0/2.96 |