Article Versions Notes

Wan X, Liu Z, Yao Y, Wan Hasan WZ, Liu T, Duan D, Xie X, Wen D. Data Uncertainty (DU)-Former: An Episodic Memory Electroencephalography Classification Model for Pre- and Post-Training Assessment. Bioengineering. 2025; 12(4):359. https://doi.org/10.3390/bioengineering12040359

Wan, Xianglong, Zheyuan Liu, Yiduo Yao, Wan Zuha Wan Hasan, Tiange Liu, Dingna Duan, Xueguang Xie, and Dong Wen. 2025. "Data Uncertainty (DU)-Former: An Episodic Memory Electroencephalography Classification Model for Pre- and Post-Training Assessment" Bioengineering 12, no. 4: 359. https://doi.org/10.3390/bioengineering12040359

Wan, X., Liu, Z., Yao, Y., Wan Hasan, W. Z., Liu, T., Duan, D., Xie, X., & Wen, D. (2025). Data Uncertainty (DU)-Former: An Episodic Memory Electroencephalography Classification Model for Pre- and Post-Training Assessment. Bioengineering, 12(4), 359. https://doi.org/10.3390/bioengineering12040359