Deng, M.; Zhang, Q.; Zhang, K.; Li, H.; Zhang, Y.; Cao, W.
A Novel Defect Inspection System Using Convolutional Neural Network for MEMS Pressure Sensors. J. Imaging 2022, 8, 268.
https://doi.org/10.3390/jimaging8100268
AMA Style
Deng M, Zhang Q, Zhang K, Li H, Zhang Y, Cao W.
A Novel Defect Inspection System Using Convolutional Neural Network for MEMS Pressure Sensors. Journal of Imaging. 2022; 8(10):268.
https://doi.org/10.3390/jimaging8100268
Chicago/Turabian Style
Deng, Mingxing, Quanyong Zhang, Kun Zhang, Hui Li, Yikai Zhang, and Wan Cao.
2022. "A Novel Defect Inspection System Using Convolutional Neural Network for MEMS Pressure Sensors" Journal of Imaging 8, no. 10: 268.
https://doi.org/10.3390/jimaging8100268
APA Style
Deng, M., Zhang, Q., Zhang, K., Li, H., Zhang, Y., & Cao, W.
(2022). A Novel Defect Inspection System Using Convolutional Neural Network for MEMS Pressure Sensors. Journal of Imaging, 8(10), 268.
https://doi.org/10.3390/jimaging8100268