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Review

Fractal Analysis on Surface Topography of Thin Films: A Review

1
Division of Advanced Manufacturing, Shenzhen International Graduate School, Tsinghua University, Shenzhen 518055, China
2
Department of Mechanical Engineering, Tsinghua University, Beijing 100084, China
*
Author to whom correspondence should be addressed.
These authors contributed equally to this work.
Fractal Fract. 2022, 6(3), 135; https://doi.org/10.3390/fractalfract6030135
Submission received: 20 December 2021 / Revised: 13 February 2022 / Accepted: 25 February 2022 / Published: 28 February 2022

Abstract

The topographies of various surfaces have been studied in many fields due to the significant influence that surfaces have on the practical performance of a given sample. A comprehensive evaluation requires the assistance of fractal analysis, which is of significant importance for modern science and technology. Due to the deep insights of fractal theory, fractal analysis on surface topographies has been widely applied and recommended. In this paper, the remarkable uprising in recent decades of fractal analysis on the surfaces of thin films, an essential domain of surface engineering, is reviewed. By summarizing the methods used to calculate fractal dimension and the deposition techniques of thin films, the results and trends of fractal analysis are associated with the microstructure, deposition parameters, etc. and this contributes profoundly to exploring the mechanism of film growth under different conditions. Choosing appropriate methods of surface characterization and calculation methods to study diverse surfaces is the main challenge of current research on thin film surface topography by using fractal theory. Prospective developing trends are proposed based on the data extraction and statistics of the published literature in this field.
Keywords: surface topography; fractal methods; thin films; deposition techniques; surface characterization; multi-scaled analysis; scaling region surface topography; fractal methods; thin films; deposition techniques; surface characterization; multi-scaled analysis; scaling region

Share and Cite

MDPI and ACS Style

Zhou, W.; Cao, Y.; Zhao, H.; Li, Z.; Feng, P.; Feng, F. Fractal Analysis on Surface Topography of Thin Films: A Review. Fractal Fract. 2022, 6, 135. https://doi.org/10.3390/fractalfract6030135

AMA Style

Zhou W, Cao Y, Zhao H, Li Z, Feng P, Feng F. Fractal Analysis on Surface Topography of Thin Films: A Review. Fractal and Fractional. 2022; 6(3):135. https://doi.org/10.3390/fractalfract6030135

Chicago/Turabian Style

Zhou, Wenmeng, Yating Cao, Haolin Zhao, Zhiwei Li, Pingfa Feng, and Feng Feng. 2022. "Fractal Analysis on Surface Topography of Thin Films: A Review" Fractal and Fractional 6, no. 3: 135. https://doi.org/10.3390/fractalfract6030135

APA Style

Zhou, W., Cao, Y., Zhao, H., Li, Z., Feng, P., & Feng, F. (2022). Fractal Analysis on Surface Topography of Thin Films: A Review. Fractal and Fractional, 6(3), 135. https://doi.org/10.3390/fractalfract6030135

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