Mollard, L.; Dieppedale, C.; Hamelin, A.; Gardien, F.; Le Rhun, G.; Hue, J.; Frey, L.; Castellan, G.
Thermal Behavior of Biaxial Piezoelectric MEMS Scanner. Proceedings 2024, 97, 223.
https://doi.org/10.3390/proceedings2024097223
AMA Style
Mollard L, Dieppedale C, Hamelin A, Gardien F, Le Rhun G, Hue J, Frey L, Castellan G.
Thermal Behavior of Biaxial Piezoelectric MEMS Scanner. Proceedings. 2024; 97(1):223.
https://doi.org/10.3390/proceedings2024097223
Chicago/Turabian Style
Mollard, Laurent, Christel Dieppedale, Antoine Hamelin, François Gardien, Gwenael Le Rhun, Jean Hue, Laurent Frey, and Gael Castellan.
2024. "Thermal Behavior of Biaxial Piezoelectric MEMS Scanner" Proceedings 97, no. 1: 223.
https://doi.org/10.3390/proceedings2024097223
APA Style
Mollard, L., Dieppedale, C., Hamelin, A., Gardien, F., Le Rhun, G., Hue, J., Frey, L., & Castellan, G.
(2024). Thermal Behavior of Biaxial Piezoelectric MEMS Scanner. Proceedings, 97(1), 223.
https://doi.org/10.3390/proceedings2024097223