Diagnostic Techniques of Laser-Driven Beams

Dear Colleagues,

In recent decades, high-intensity laser plasma interactions have been intensively studied, with the main aim to generate high-energy, high-flux, ultra-short, and compact secondary radiation sources. Laser plasma secondary sources are characterized by a wide range of radiation (ions, electrons, XUV and gamma rays, THz radiation) with broad spectra (keV-GeV), thus calling for the research and development of ad hoc diagnostic systems and techniques, both using active and passive detectors.

The laser-driven particle acceleration of multi-MeV ion and multi-GeV electron beams is experimentally realized every day by using various approaches, thus demonstrating that compact secondary sources can be potentially used for multidisciplinary applications. However, the characterization of laser plasma-produced radiation is often based on ad hoc detectors, which are not available commercially, but are developed by a single research team and used in a given laboratory, thus posing challenges for the intercomparison of experimental results achieved at different laboratories around the world. This challenge becomes even more severe for societal applications of laser driven secondary sources, where technical requirements for the use of such novel radiation sources are very stringent.

The main goal of the Special Issue on “Diagnostic Techniques for Laser-Plasma produced Radiation” is to present a comprehensive collection of the most recent achievements in the research and development of novel diagnostic devices and techniques for characterization laser-plasma secondary sources. The Issue will be organized into two main sections: i) review papers focused on state-of-the-art detectors, and diagnostic methods for a given source and/or field of application; ii) original research contributions on novel diagnostics for laser-driven secondary sources and their multidisciplinary applications.

Prof. Dr. Pablo Cirrone
Dr. Roberto Versaci
Prof. Dr. Daniele Margarone
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

• X- and gamma-ray diagnostics
• electron beam diagnostics
• ion beam diagnostics
• neutron diagnostics
• diagnostic for optical plasma probing
• EMP characterization and signal contamination
• dosimetry of laser-driven radiation
• detector simulations
• detector calibrations
• radiation damage and hardness
• electronic front-end and control system of pulsed beams
• engineering challenges for laser plasma radiation detection