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Electronics
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Feature Papers

A special issue of Electronics (ISSN 2079-9292).

Deadline for manuscript submissions: closed (30 September 2012) | Viewed by 59051

Special Issue Editors

Prof. Dr. Mostafa Bassiouni

E-Mail Website
Guest Editor
Department of Computer Science, University of Central Florida, Orlando, FL 32816, USA
Interests: computer networks; wireless networks; performance evaluation; distributed and real-time protocols; distributed systems; operating systems; databases
Prof. Dr. Guifang Li

E-Mail Website
Guest Editor
The College of Optics & Photonics, University of Central Florida, Orlando, FL 32816, USA
Interests: optical communications and networking; RF photonics; all-optical signal processing

Special Issue Information

Dear Colleagues,

This special issue is intended to present feature and scholarly papers that address some of the diverse array of topics related to Electronics. These topics include but are not limited to computer and information technology; wireless and mobile communications; instrumentation, measurement and testing; microwave techniques and devices; satellite communication systems; photonics and optical communications; radar and sonar technology; semiconductors and signal processing; control and embedded systems; and biomedical electronics. Technological advances in all these areas have profoundly affected all aspects of modern life. A large number of people worldwide entirely depend on modern electronic devices on a daily basis. Various electronic services and products are critically important for the successful functioning of all sectors of modern economy including health, education, e-commerce, manufacturing, retail industry, real state, mass media, sports, entertainment, transport and tourism. We invite scientists and researchers from all fields of electronics to submit papers for this important first special issue of Electronics. Case studies, reviews and research papers on all topics related to electronics are invited.

Prof. Dr. Mostafa Bassiouni
Prof. Dr. Guifang Li
Guest Editors

Keywords

  • wireless, sensor and mobile communications
  • microwave devices and satellite communications
  • power electronics and motor drives
  • renewable energy and energy conversion
  • computer architecture, parallel processing and optimization
  • semiconductors and integrated circuit devices
  • signal, video and image processing
  • control systems, intelligent systems and robotics
  • optical communications and laser technology
  • biomedical engineering and bioinformatics
  • multimedia database systems and data mining

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Further information on MDPI's Special Issue policies can be found here.

Published Papers (5 papers)

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Research

Jump to: Review

34 pages, 1570 KiB  
Article
A Simulative Study on Active Disturbance Rejection Control (ADRC) as a Control Tool for Practitioners
by Gernot Herbst
Electronics 2013, 2(3), 246-279; https://doi.org/10.3390/electronics2030246 - 15 Aug 2013
Cited by 207 | Viewed by 19121
Abstract
As an alternative to both classical PID-type and modern model-based approaches to solving control problems, active disturbance rejection control (ADRC) has gained significant traction in recent years. With its simple tuning method and robustness against process parameter variations, it puts itself forward as [...] Read more.
As an alternative to both classical PID-type and modern model-based approaches to solving control problems, active disturbance rejection control (ADRC) has gained significant traction in recent years. With its simple tuning method and robustness against process parameter variations, it puts itself forward as a valuable addition to the toolbox of control engineering practitioners. This article aims at providing a single-source introduction and reference to linear ADRC with this audience in mind. A simulative study is carried out using generic first- and second-order plants to enable a quick visual assessment of the abilities of ADRC. Finally, a modified form of the discrete-time case is introduced to speed up real-time implementations as necessary in applications with high dynamic requirements. Full article
(This article belongs to the Special Issue Feature Papers)
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15 pages, 2241 KiB  
Article
Modified EAS Tag Used as a Resistive Sensor Platform
by Henrik Andersson, Krister Hammarling, Johan Sidén, Anatoliy Manuilskiy, Thomas Öhlund and Hans-Erik Nilsson
Electronics 2012, 1(2), 32-46; https://doi.org/10.3390/electronics1020032 - 9 Nov 2012
Cited by 3 | Viewed by 12604
Abstract
In this article, a modified design of an RF Radio Frequency Electronic Article Surveillance (EAS) tag, used as a sensor platform, is manufactured and characterized. EAS tags are passive devices consisting of a capacitor and coil, tuned to a resonance frequency readable by [...] Read more.
In this article, a modified design of an RF Radio Frequency Electronic Article Surveillance (EAS) tag, used as a sensor platform, is manufactured and characterized. EAS tags are passive devices consisting of a capacitor and coil, tuned to a resonance frequency readable by the detector equipment, in this case 8.2 MHz. They were originally used to detect whether merchandise was being moved through the detection gates at shop exits, in which case an alarm was triggered. If the capacitance is divided in two and a resistive sensor device inserted in between, the resonant Inductor-Capacitor (LC) circuit becomes an Inductor-Capacitor-Capacitor-Resistor LCCR circuit and can be used as a sensor tag. A high sensor resistance means that one capacitor is decoupled, leading to one resonance frequency, while a low resistance will couple both capacitances into the circuit, resulting in a lower resonance frequency. Different types of resistive sensors exist that are able to detect properties such as pressure, moisture, light and temperature. The tag is manufactured in Aluminum foil on a polyetylentereftalat (PET) substrate, resulting in a cost effective RF-platform for various resistive sensors. Two types of tags are designed and manufactured, one with parallel plate capacitors and the other with interdigital capacitors. To test the tags, a resistive tilt sensor is mounted and the tags are characterized using a network analyzer. It is shown that for high resistance, the tags have a resonance frequency of morethan 10 MHz while for low values the frequency approaches 8.2 MHz. Full article
(This article belongs to the Special Issue Feature Papers)
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9 pages, 354 KiB  
Article
Radiation Effects in Carbon Nanoelectronics
by Cory D. Cress, Julian J. McMorrow, Jeremy T. Robinson, Brian J. Landi, Seth M. Hubbard and Scott R. Messenger
Electronics 2012, 1(1), 23-31; https://doi.org/10.3390/electronics1010023 - 3 Jul 2012
Cited by 34 | Viewed by 11390
Abstract
We experimentally investigate the effects of Co-60 irradiation on the electrical properties of single-walled carbon nanotube and graphene field-effect transistors. We observe significant differences in the radiation response of devices depending on their irradiation environment, and confirm that, under controlled conditions, standard dielectric [...] Read more.
We experimentally investigate the effects of Co-60 irradiation on the electrical properties of single-walled carbon nanotube and graphene field-effect transistors. We observe significant differences in the radiation response of devices depending on their irradiation environment, and confirm that, under controlled conditions, standard dielectric hardening approaches are applicable to carbon nanoelectronics devices. Full article
(This article belongs to the Special Issue Feature Papers)
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20 pages, 1066 KiB  
Article
Multiple Bit Error Tolerant Galois Field Architectures Over GF (2m)
by Mahesh Poolakkaparambil, Jimson Mathew and Abusaleh Jabir
Electronics 2012, 1(1), 3-22; https://doi.org/10.3390/electronics1010003 - 26 Jun 2012
Cited by 4 | Viewed by 6984
Abstract
Radiation induced transient faults like single event upsets (SEU) and multiple event upsets (MEU) in memories are well researched. As a result of the technology scaling, it is observed that the logic blocks are also vulnerable to malfunctioning when they are deployed in [...] Read more.
Radiation induced transient faults like single event upsets (SEU) and multiple event upsets (MEU) in memories are well researched. As a result of the technology scaling, it is observed that the logic blocks are also vulnerable to malfunctioning when they are deployed in radiation prone environment. However, the current literature is lacking efforts to mitigate such issues in the digital logic circuits when exposed to natural radiation prone environment or when they are subjected to malicious attacks by an eavesdropper using highly energized particles. This may lead to catastrophe in critical applications such as widely used cryptographic hardware. In this paper, novel dynamic error correction architectures, based on the BCH codes, is proposed for correcting multiple errors which makes the circuits robust against radiation induced faults irrespective of the location of the errors. As a benchmark test case, the finite field multiplier circuit is considered as the functional block which can be the target for major attacks. The proposed scheme has the capability to handle stuck-at faults that are also a major cause of failure affecting the overall yield of a nano-CMOS integrated chip. The experimental results show that the proposed dynamic error detection and correction architecture results in 50% reduction in critical path delay by dynamically bypassing the error correction logic when no error is present. The area overhead for the larger multiplier is within 150% which is 33% lower than the TMR and comparable to 130% overhead of single error correcting Hamming and LDPC based techniques. Full article
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Review

Jump to: Research

55 pages, 2760 KiB  
Review
High-Feedback Operation of Power Electronic Converters
by Zhanybai T. Zhusubaliyev, Erik Mosekilde, Alexey I. Andriyanov and Gennady Y. Mikhal'chenko
Electronics 2013, 2(2), 113-167; https://doi.org/10.3390/electronics2020113 - 27 Mar 2013
Cited by 17 | Viewed by 7716
Abstract
The purpose of this review is to provide a survey of some of the most important bifurcation phenomena that one can observe in pulse-modulated converter systems when operating with high corrector gain factors. Like other systems with switching control, electronic converter systems belong [...] Read more.
The purpose of this review is to provide a survey of some of the most important bifurcation phenomena that one can observe in pulse-modulated converter systems when operating with high corrector gain factors. Like other systems with switching control, electronic converter systems belong to the class of piecewise-smooth dynamical systems. A characteristic feature of such systems is that the trajectory is “sewed” together from subsequent discrete parts. Moreover, the transitions between different modes of operation in response to a parameter variation are often qualitatively different from the bifurcations we know for smooth systems. The review starts with an introduction to the concept of border-collision bifurcations and also demonstrates the approach by which the full dynamics of the piecewise-linear, time-continuous system can be reduced to the dynamics of a piecewise-smooth map. We describe the main bifurcation structures that one observes in three different types of converter systems: (1) a DC/DC converter; (2) a multi-level DC/DC converter; and (3) a DC/AC converter. Our focus will be on the bifurcations by which the regular switching dynamics becomes unstable and is replaced by ergodic or resonant periodic dynamics on the surface of a two-dimensional torus. This transition occurs when the feedback gain is increased beyond a certain threshold, for instance in Electronics 2013, 2 114 order to improve the speed and accuracy of the output voltage regulation. For each of the three converter types, we discuss a number of additional bifurcation phenomena, including the formation and reconstruction of multi-layered tori and the appearance of phase-synchronized quasiperiodicity. Our numerical simulations are compared with experimentally observed waveforms. Full article
(This article belongs to the Special Issue Feature Papers)
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