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Advances in Machine Condition Monitoring and Fault Diagnosis
This special issue belongs to the section “Industrial Electronics“.
Special Issue Information
Dear Colleagues,
Condition monitoring and fault diagnosis have demonstrated its effectiveness in improving the operation, maintenance, availability and therefore economic return of machines. They will play a more vital role in the future industrial production process with the rapid development of modern machinery industry. That requests the condition monitoring and fault diagnosis techniques to be more reliable and efficient in practical use. However, this is challenged by the fact that modern machines are becoming more complex in structure, larger in size, and operate under harsher loading and operational conditions. This Special Issue will provide an open platform for reporting and sharing the latest advances in this field. The topics of interest for publication in this Special issue include, but are not limited to, the following:
- Machine condition monitoring
- Structural health condition monitoring
- Signal processing
- Data analysis
- Image processing
- Fault diagnosis
- Non-destructive testing
- Non-destructive evaluation
- Mathematical models for health monitoring
- Data mining
- Artificial intelligence
Dr. Wenxian Yang
Prof. Dr. Radoslaw Zimroz
Dr. Mayorkinos Papaelias
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- Condition monitoring
- Fault diagnosis
- Signal processing
- Data analysis
- Non-destructive testing
- Non-destructive evaluation
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