Failure Analysis and Reliability Assessment in Power Electronic Systems
A special issue of Energies (ISSN 1996-1073). This special issue belongs to the section "F: Electrical Engineering".
Deadline for manuscript submissions: closed (10 October 2021) | Viewed by 292
Special Issue Editor
Interests: microelectronics device reliability; microelectronic system reliability; power electrtonics using GaN transistors; SiC and GaN in power electronic systems
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
We are excited and proud to present a Special Issue on reliability, specifically in the field of power electronic systems. The editors of this Special Issue are interested in promoting the latest innovations for high speed, high power electronics and, more specifically, the reliability impact. As the field of power electronics is very conservative, innovation generally takes longer to gain traction, and new methods must be found to expedite the reliability assessment. This includes new test circuit architectures, failure analysis of new materials and devices (i.e. GaN and SiC), and high-speed analysis of the switching performance of electronics. We want to explore state of the art analyses and approaches for extrapolating time to fail for new, high speed, high performance, and high efficiency power electronics. Our primary emphasis will be on new and innovative models for the failure physics and mathematical justification for lifetime extrapolation in real-world environments.
Prof. Joseph Bernstein
Guest Editor
Manuscript Submission Information
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Keywords
- Reliability assessment
- Lifetime prediction
- Failure analysis
- Physics of failure
- Lifetime models
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