Optical Imaging and Detection Applied in Characterizing Material Properties
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Optical and Photonic Materials".
Deadline for manuscript submissions: closed (20 November 2023) | Viewed by 2862
Special Issue Editor
Special Issue Information
Dear Colleagues,
Some materials have unique optical properties (such as refractive index, reflectance, absorbance, band gap, photoluminescence, and transmittance) due to their special structures. To characterize and evaluate these properties, various optical imaging and detection methods have been developed to provide abundant spatial and spectral information.
Modern optical techniques can provide functional and molecular information with high spatial resolution, deep penetration, enhanced temporal responsiveness, and improved chemical specificity. In recent years, these techniques have been increasingly tailored for characterizing materials and probing their interactions with biological tissues. Here, in this Special Issue, we aim to collect papers covering the latest progress of advances in both optical modalities and new applications in characterizing material properties.
The optical principles and methods used to evaluate the performance of emerging materials in different physical conditions will be of valuable reference for the researchers working in the material science field. Notable research works also include theories and models relating linear and nonlinear optical properties to those of the constituent materials and to the morphology of the composite structure.
This Special Issue, “Optical Imaging and Detection Applied in Characterizing Material Properties”, pays attention to the combination of material properties and optical analysis. Topics of interest include, but are not limited to: optical experiments and theoretical studies relating to material science; optical monitoring during material manufacturing and processing; microscopic to macroscopic material analysis; and performance verification techniques.
It is my pleasure to invite you to submit a manuscript for this Special Issue. Various advances in optical imaging and detection systems, modeling and simulation, theoretical calculation, and application demonstration on the optical characterization of material properties are welcome.
Dr. Nan Zeng
Guest Editor
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- characterization and control of stress in films
- stability and modification of film and surface properties
- microstructural determinations
- biomaterial-tissue interactions
- micro-nano scale
- optoelectronics
- spectroscopy
- polarization and ellipsometry
- surface plasmon resonance
- second harmonic generation
- microscopy
- noninvasive characterization
- surface roughness and scattering
- polymer thin films
- molecular aggregates and molecular crystals
- biological materials
- mono-, bi-, and multi-layer films
- photonic crystals or metamaterials
- anisotropic materials
- multilayer optical coatings
