Research on Green and Environmentally Friendly Lead-Free Solder and Advanced Interconnect Technology in Electronic Packaging

A special issue of Metals (ISSN 2075-4701). This special issue belongs to the section "Welding and Joining".

Deadline for manuscript submissions: closed (30 July 2024) | Viewed by 754

Special Issue Editor


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Guest Editor
Faculty of Materials and Manufacturing, Beijing University of Technology, Beijing, China
Interests: intermetallic compounds; reliabiliy; surface coating; electromigration; solder; thermoelectric generator; stacking packaging; through silicon via; interfacial diffusion

Special Issue Information

Dear Colleagues,

In the process of connecting microelectronics, the industry not only needs to prohibit the doping of harmful elements from the source, but also ensure the reliability of the connection. This requires researchers to propose new strategies in terms of connection technology, materials and structural design. Since the end of the 1990s, many researchers have attempted to improve the reliability of tin-based solder and to regulate the properties of intermetallic compounds to weaken the brittle tendency of solder joints, whether they are from the solder itself, the interface coating or external conditions. In addition, the reuse of solid waste resources of electronic products is also a new theme of green connection, and the design of electronic products should also consider the convenience of recycling. Methods of recovering valuable rare elements from electronic products is also an important issue.

Prof. Dr. Limin Ma
Guest Editor

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Keywords

  • intermetallic compounds
  • microelectronics connection
  • reliability
  • tin-based solder
  • electronic solid waste
  • recycling

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Published Papers (1 paper)

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Research

27 pages, 30719 KiB  
Article
The Effect of Multiple Solder Reflows on the Formation of Cu6Sn5 Intermetallics and the Decomposition of SnAg3.0Cu0.5 Solder Joints in the Framework of Rework and Reuse of MLCC Components
by Erik Wiss and Steffen Wiese
Metals 2024, 14(9), 986; https://doi.org/10.3390/met14090986 - 29 Aug 2024
Viewed by 338
Abstract
A rework of electronic assemblies and the reuse of electronic components are the most effective ways to reduce electronic waste. Since neither components nor substrates were developed with the intention of multiple usage, the question of how the integrity of lead-free solder joints [...] Read more.
A rework of electronic assemblies and the reuse of electronic components are the most effective ways to reduce electronic waste. Since neither components nor substrates were developed with the intention of multiple usage, the question of how the integrity of lead-free solder joints is affected by multiple reflow operations is crucial for the implementation of any reuse strategy. Therefore, various types of 1206 multilayer ceramic capacitors (MLCCs) differing in their capacitance value and dielectric type (X5R, X7R, Y5V, NP0) were soldered on test printed circuit boards (PCBs) having a pure Cu-metallization surface in order to investigate the intermetallic reactions during multiple reflows. The metallization system on the MLCC-component side consisted of a thick film of Ni covered by galvanic-deposited Sn. The reflow experiments were conducted using a hypoeutectic SnAgCu solder. The results show the formation of a Cu6Sn5 intermetallic phase on both metallizations, which grows homogeneously with the number of reflows. Moreover, an ongoing decomposition of the solder into Ag-enriched and depleted zones was observed. The effect of these microstructural changes on the functionality of the solder joint was investigated by mechanical shear experiments and electrical four-point capacitance measurements. Full article
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