New Advances in Applications of Nanoscale Imaging and Nanoscopy

A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Physical Chemistry at Nanoscale".

Deadline for manuscript submissions: 20 April 2025 | Viewed by 363

Special Issue Editor


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Guest Editor
Institute of Microelectronics Technology and Materials, Hebei University of Technology, Tianjin 300130, China
Interests: SEM imaging of semiconductors and 2D materials

Special Issue Information

Dear Colleagues,

This Special Issue on “New Advances in Applications of Nanoscale Imaging and Nanoscopy” focuses on the comprehensive research outlining the progress on the application of nanoscale imaging of materials (including 1D and 2D materials, dopant profiling, and other nanomaterials) using electron microscopy, scanning probe microscopy, etc. It includes topics related to. In this Special Issue, the leading groups of the field have been invited to contribute original research articles and review articles covering the current progress on nanoscale imaging and nanoscopy.

Dr. Li Huang
Guest Editor

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Keywords

  • low-voltage EM
  • low-dimensional and 2D materials
  • semiconductors
  • property calculations

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Published Papers (1 paper)

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Research

18 pages, 6321 KiB  
Article
Enhanced Imaging in Scanning Transmission X-Ray Microscopy Assisted by Ptychography
by Shuhan Wu, Zijian Xu, Ruoru Li, Sheng Chen, Yingling Zhang, Xiangzhi Zhang, Zhenhua Chen and Renzhong Tai
Nanomaterials 2025, 15(7), 496; https://doi.org/10.3390/nano15070496 - 26 Mar 2025
Viewed by 91
Abstract
Scanning transmission X-ray microscopy (STXM) is a direct imaging technique with nanoscale resolution. But its resolution is limited by the spot size on the sample, i.e., by the manufacturing technique of the focusing element. As an emerging high-resolution X-ray imaging technique, ptychography utilizes [...] Read more.
Scanning transmission X-ray microscopy (STXM) is a direct imaging technique with nanoscale resolution. But its resolution is limited by the spot size on the sample, i.e., by the manufacturing technique of the focusing element. As an emerging high-resolution X-ray imaging technique, ptychography utilizes highly redundant data from overlapping scans as well as phase retrieval algorithms to simultaneously reconstruct a high-resolution sample image and a probe function. In this study, we designed an accurate reconstruction strategy to obtain the probe spot with the vibration effects being eliminated, and developed an image enhancement technique for STXM by combining the reconstructed probe with the deconvolution algorithm. This approach significantly improves the resolution of STXM imaging and can break the limitation of the focal spot on STXM resolution when the scanning step size is near or below the spot size, while the data processing time is much shorter than that of ptychography. Both simulations and experiments show that this approach can be applied to STXM data at different energies and different scan steps using the same focal spot retrieved via ptychography. Full article
(This article belongs to the Special Issue New Advances in Applications of Nanoscale Imaging and Nanoscopy)
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