Advanced Sensing for Scanning Probe Microscopy
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Nanosensors".
Deadline for manuscript submissions: closed (30 June 2023) | Viewed by 2966
Special Issue Editors
Interests: scanning probe microscopy; sensors; metrology; nanotechnology; automation
Interests: lasers and photonics; interferometry; protein (silk) based optical sensing; metrology; imaging; nanotechnology; information theory
Special Issue Information
Dear Colleagues,
Scanning probe microscopy (SPM) has transformed surface science and has initiated the development of nanotechnology. With its versatility and unmatched selective, local, and high-resolution measurement capabilities, SPM has become an indispensable characterising technique for a wide range of different environments and systems. As a result of ongoing advances, particularly in sensing, SPM reinforced its polyvalent role in controlling, manipulating and manufacturing at the nanoscale.
In the last decade, there has been a resurgence in interest due to the rapid development of a new generation of sensors, such as those based on nanowires, nitrogen vacancy centres in diamond, and quantum dots. These nanosensors are enabling unprecedented sensitivity and imaging resolution for magnetometry and electrometry. Along with other advances, they have had a high impact in several areas ranging from biosensing in real time to revealing correlated phenomena in low-dimensional systems, hindered so far by disorder and inhomogeneity. Non-traditional applications of SPM are continuing to emerge, facilitating the translation from proof of concept through to validation, metrology and quality control for future advanced manufacturing. Finally, data visualisation remains a continuing challenge for the SPM community, especially in the light of viable multi-sensing platforms with an increasing number of measured parameters recorded in ever larger data sets.
It is challenging to enumerate all of the progress, and undoubtedly impossible to predict prospects in sensing innovations for SPM; therefore, we invite you to share your results, research and novel concepts in our Special Issue, "Advanced Sensing for Scanning Probe Microscopy". This Special Issue is open to works reporting the experimental results of fundamental and applied research, but also to theoretical works on, but not limited to, the following topics:
- New concepts for SPM sensors;
- SPM sensor design and fabrication for new applications;
- Metrology of SPM sensing;
- Quantum-enhanced sensing;
- The development of nanomaterial/metamaterial for nanosensors;
- Sensors for high-speed scanning;
- Biosensing with SPM;
- Emerging applications of SPM sensing for advanced manufacturing and quality control;
- Data visualisation for SPM measurements.
Dr. Bakir Babić
Dr. Douglas Little
Dr. James Cooper
Guest Editors
Manuscript Submission Information
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Keywords
- scanning probe microscopy
- sensing
- imaging
- metrology
- nanoscale
- quantum enhancement
- advanced manufacturing
- data visualisation
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