Fault Diagnosis and Electronic Engineering in Symmetry

A special issue of Symmetry (ISSN 2073-8994). This special issue belongs to the section "Computer".

Deadline for manuscript submissions: closed (31 December 2025) | Viewed by 2281

Special Issue Editor


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Guest Editor
School of Electrical and Electronic Engineering, North China Electric Power University, Baoding 071003, China
Interests: electromagnetic phenomena; underground cables; partial discharges; insulation; active power-line conditioner; harmonics compensation
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Special Issue Information

Dear Colleagues,

Symmetry is a fundamental feature in the scientific and engineering world. In the context of fault diagnosis, symmetry can be related to the classification of fault types. For example, in power systems where the faults need to be detected by electronic devices, symmetrical faults denote a type of fault where the parameters of the three-phase circuit are symmetrical. In the broader context of electronic system fault diagnosis, this symmetry-based fault classification method can also be utilized to identify and handle faults more accurately.

Intelligent diagnosis employs artificial intelligence and machine learning techniques to enhance the accuracy and efficiency of fault diagnosis. By training models to recognize fault patterns, the rapid identification and location of faults can be achieved. The models usually have a symmetrical nature by their own.

Contributions covering the symmetry of fault characteristics or diagnostic methods are welcome.

Dr. Yan Li
Guest Editor

Manuscript Submission Information

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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Symmetry is an international peer-reviewed open access monthly journal published by MDPI.

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Keywords

  • electronic degradation
  • fault diagnostics
  • fault location
  • lifespan prediction
  • status evaluation
  • symmetrical fault
  • system reliability

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Published Papers (2 papers)

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Research

20 pages, 784 KB  
Article
An Online Reduced KPLS Data-Driven Method for Fault Diagnosis of Nonlinear Processes
by Maroua Said, Okba Taouali, Kamel Zidi and Wad Ghaban
Symmetry 2025, 17(11), 1863; https://doi.org/10.3390/sym17111863 - 4 Nov 2025
Viewed by 685
Abstract
System security is a very important organizational task for the system to maintain proper functioning and to prevent modifications or hijacking of the system. Indeed, it is necessary to address any detected problem or defect to protect human beings, industry, and machines. So [...] Read more.
System security is a very important organizational task for the system to maintain proper functioning and to prevent modifications or hijacking of the system. Indeed, it is necessary to address any detected problem or defect to protect human beings, industry, and machines. So the identification, after the fault detection phase, of the variables correlated to the detected or occurred fault is a very important step. For this purpose, this paper proposes a nonlinear machine learning method for fault diagnosis. Indeed, the Reduced Kernel Partial Least Squares (RKPLS) is proposed as a processing method for the suitable localization of detected faults. The idea of this approach is to generate partial RKPLS models, using the principle of structured symmetry residues, with reduced sets of variables. On the other hand, the Fault Isolation (FI) using the online RKPLS method (ORKPLS) is developed in this article to generate indices of fault detection sensitive to certain faults and insensitive to others. Thus, a partial ORKPLS method, for fault isolation, is proposed to secure the systems and ensure a proper operation. The suggested approaches are applied for monitoring the continuous stirred tank reactor (CSTR) and the Air quality monitoring network (AIRLOR). The obtained results underscore the role of leveraging symmetry in designing fault. Full article
(This article belongs to the Special Issue Fault Diagnosis and Electronic Engineering in Symmetry)
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11 pages, 3534 KB  
Article
Arc Fault Location for Photovoltaic Distribution Cables Based on Time Reversal
by Jingang Su, Xingwang Huang, Peng Zhang, Xianhai Pang, Yuwei Liang, Longxiang Zhang, Yanfei Bai and Yan Li
Symmetry 2025, 17(2), 240; https://doi.org/10.3390/sym17020240 - 6 Feb 2025
Viewed by 1184
Abstract
The direct current (DC) cable serves as the link for energy output in photovoltaic (PV) systems. Its degradation can cause arcs, which easily lead to fire accidents. Locating arc faults, however, is challenging. To cope with it, this paper proposes an arc location [...] Read more.
The direct current (DC) cable serves as the link for energy output in photovoltaic (PV) systems. Its degradation can cause arcs, which easily lead to fire accidents. Locating arc faults, however, is challenging. To cope with it, this paper proposes an arc location method based on time reversal. The method has been tried to locate system fault. However, its application in the arc fault location of photovoltaic systems is seldom discussed and needs further research. For this purpose, the voltage waveforms of an arc fault collected at one of the cable ends is reversed. This transformation derives a symmetrical arc fault signal. Afterwards, the reversed signal is injected back into the cable to trace the fault location, which is a symmetrical process of the arc fault signal travelling from its origin to the detection point. Utilizing the energy-focusing characteristics of time reversal, the position with the highest energy in the derived waveform corresponds to the actual fault location. To verify the proposed method, a DC arc fault test is performed to obtain the wave characteristics. The Paukert arc model is chosen based on the tested result. A PV system containing a DC cable with an arc fault is simulated with Simulink with the affecting factors, i.e., grounded resistance, cable length, fault location and sampling frequency. The simulated results demonstrate that the localization error is within 5% in the worst case. Full article
(This article belongs to the Special Issue Fault Diagnosis and Electronic Engineering in Symmetry)
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