Modern Methods for Measuring the Functional Characteristics of Surfaces
A special issue of Technologies (ISSN 2227-7080). This special issue belongs to the section "Innovations in Materials Processing".
Deadline for manuscript submissions: closed (30 November 2018) | Viewed by 18434
Special Issue Editors
Interests: surface metrology; optimization of difficult-to-cut materials; sensor technology; metrology; measurement uncertainty; environmental measurement; optimization of geometrical and physical parameters of surface integrity
Special Issues, Collections and Topics in MDPI journals
Interests: basics of metrology; dimensional metrology; surface metrology; uncertainty analysis
Special Issues, Collections and Topics in MDPI journals
Interests: surface metrology; topography; coordinate measuring technique; computed tomography; scanning
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Surface topography has a profound influence on the function of a surface. In industrial practice, geometric product specification is an important issue. The measurement and characterization of the geometric features of machined parts is important when trying to determine the functional properties of surfaces, and also in the control of process parameters during manufacturing. However, there are many other areas of science, engineering and even the arts where surface topography is critical to function.
The aim of this Special Issue is to provide an international forum for the dissemination of scientific information on surface metrology—submission from all fields involving the measurement and characterization of surface topography, including archaeology, art conservation, anthropology, biology, biomedical engineering, chemistry, civil engineering, food science, forensics, geodetics, geology, material science, mechanical engineering, manufacturing, metrology, nanotechnology, tribology, and others. The Special Issue covers the modelling, design, and characterization of surfaces and the relationship between surface properties and their applications. This Special Issue accepts high-quality articles containing original research results and review papers regarding metrology, development, and application of the science and technology of measurement, instrumentation and characterisation.
Prof. Dr. Grzegorz Krolczyk
Prof. Dr. Richard Leach
Prof. Dr. Michal Wieczorowski
Guest Editors
Manuscript Submission Information
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