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Keywords = AFM microcantilevers

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9 pages, 3564 KB  
Communication
Pico-Dispensed Zinc Oxide Nanoparticles for Actuation of Microcantilevers: A Precise Deposition Approach
by Paweł Janus, Anna Katarzyna Piotrowska, Piotr Prokaryn, Andrzej Sierakowski, Jan Prokaryn and Rafał Dobrowolski
Sensors 2025, 25(12), 3689; https://doi.org/10.3390/s25123689 - 12 Jun 2025
Viewed by 2671
Abstract
This paper presents a cost-effective and versatile pico-dispensing technique as an efficient and straightforward approach for depositing zinc oxide nanoparticle (ZnO—NP) thin films on micromechanical devices (MEMS). Due to its piezoelectric properties, bulk ZnO is commonly used as a material for micro-/nanocantilever actuation. [...] Read more.
This paper presents a cost-effective and versatile pico-dispensing technique as an efficient and straightforward approach for depositing zinc oxide nanoparticle (ZnO—NP) thin films on micromechanical devices (MEMS). Due to its piezoelectric properties, bulk ZnO is commonly used as a material for micro-/nanocantilever actuation. The pico-dispensing process provides precise control over the deposition, allowing uniform and localized application of ZnO—NP on microcantilevers. Compared to traditional ZnO deposition techniques (e.g., sputtering or sol–gel), pico-dispensing of ZnO—NP offers advantages in simplicity, reduced material waste, and significantly lower costs. Furthermore, it is easy to tailor the composition and properties by incorporating nanoparticles of other materials. Experimental results demonstrate that ZnO—NP thin films deposited via pico-dispensing enable actuation with amplitudes of several nanometers and bandwidths up to 250 kHz, making them potentially suitable for actuation of micromechanical devices such as in dynamic AFM modes. Full article
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13 pages, 2526 KB  
Article
A Novel Nano-Spherical Tip for Improving Precision in Elastic Modulus Measurements of Polymer Materials via Atomic Force Microscopy
by Tianyu Fu, Paul C. Uzoma, Xiaolei Ding, Pengyuan Wu, Oleksiy Penkov and Huan Hu
Micromachines 2024, 15(9), 1175; https://doi.org/10.3390/mi15091175 - 22 Sep 2024
Cited by 2 | Viewed by 2386
Abstract
Micro-nano-scale mechanical properties are vital for engineering and biological materials. The elastic modulus is generally measured by processing the force–indentation curves obtained by atomic force microscopy (AFM). However, the measurement precision is largely affected by tip shape, tip wear, sample morphology, and the [...] Read more.
Micro-nano-scale mechanical properties are vital for engineering and biological materials. The elastic modulus is generally measured by processing the force–indentation curves obtained by atomic force microscopy (AFM). However, the measurement precision is largely affected by tip shape, tip wear, sample morphology, and the contact model. In such research, it has been found that the radius of the sharp tip increases due to wear during contact scanning, affecting elastic modulus calculations. For flat-ended tips, it is difficult to identify the contact condition, leading to inaccurate results. Our research team has invented a nano-spherical tip, obtained by implanting focused helium ions into a silicon microcantilever, causing it to expand into a silicon nanosphere. This nano-spherical tip has the advantages of sub-micro size and a smooth spherical surface. Comparative tests of the elastic modulus measurement were conducted on polytetrafluoroethylene (PTFE) and polypropylene (PP) using these three tips. Overall, the experimental results show that our nano-spherical tip with a consistent tip radius, symmetrical geometric shape, and resistance to wear and contamination can improve precision in elastic modulus measurements of polymer materials. Full article
(This article belongs to the Special Issue Micro/Nanostructures in Sensors and Actuators, 2nd Edition)
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14 pages, 4852 KB  
Article
The Impact of the Damping Coefficient on the Dynamic Stability of the TM-AFM Microcantilever Beam System
by Peijie Song, Xiaojuan Li, Jianjun Cui, Kai Chen and Yandong Chu
Appl. Sci. 2024, 14(7), 2910; https://doi.org/10.3390/app14072910 - 29 Mar 2024
Cited by 1 | Viewed by 1354
Abstract
The tapping-mode atomic force microscope (TM-AFM) is widely used today; however, improper matching between the operating medium and the sampling time may lead to inaccurate measurement results. The relationship between the damping coefficient and the steady state of the TM-AFM microcantilever is investigated [...] Read more.
The tapping-mode atomic force microscope (TM-AFM) is widely used today; however, improper matching between the operating medium and the sampling time may lead to inaccurate measurement results. The relationship between the damping coefficient and the steady state of the TM-AFM microcantilever is investigated in this paper using multiple stability theory. Firstly, the effects of changes in dimensionless linear damping coefficients and dimensionless piezoelectric film damping coefficients on the motion stability of the system are examined using bifurcation diagrams, phase trajectories, and domains of attraction. Subsequently, the degrees of effect of the two damping coefficients on the stability of the system are compared. Finally, the bi-parametric bifurcation characteristics of the system under a specific number of iterative cycles are investigated using the bi-parametric bifurcation diagram in conjunction with the actual working conditions, and the boundary conditions for the transition of the system’s motion from an unstable state to a stable state are obtained. The results of the study show that to ensure the accuracy and reliability of the individual measurement data in 500 iteration cycles, the dimensionless linear damping coefficient must be greater than 0.01014. Our results will provide valuable references for TM-AFM measurement media selection, improving TM-AFM imaging quality, measurement accuracy and maneuverability, and TM-AFM troubleshooting. Full article
(This article belongs to the Section Applied Physics General)
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18 pages, 12011 KB  
Article
Investigation on the Impact of Excitation Amplitude on AFM-TM Microcantilever Beam System’s Dynamic Characteristics and Implementation of an Equivalent Circuit
by Peijie Song, Xiaojuan Li, Jianjun Cui, Kai Chen and Yandong Chu
Sensors 2024, 24(1), 107; https://doi.org/10.3390/s24010107 - 25 Dec 2023
Cited by 1 | Viewed by 1431
Abstract
Alterations in the dynamical properties of an atomic force microscope microcantilever beam system in tapping mode can appreciably impact its measurement precision. Understanding the influence mechanism of dynamic parameter changes on the system’s motion characteristics is vital to improve the accuracy of the [...] Read more.
Alterations in the dynamical properties of an atomic force microscope microcantilever beam system in tapping mode can appreciably impact its measurement precision. Understanding the influence mechanism of dynamic parameter changes on the system’s motion characteristics is vital to improve the accuracy of the atomic force microscope in tapping mode (AFM-TM). In this study, we categorize the mathematical model of the AFM-TM microcantilever beam system into systems 1 and 2 based on actual working conditions. Then, we analyze the alterations in the dynamic properties of both systems due to external excitation variations using bifurcation diagrams, phase trajectories, Lyapunov indices, and attraction domains. The numerical simulation results show that when the dimensionless external excitation g < 0.183, the motion state of system 2 is period 1. When g < 0.9, the motion state of system 1 is period 1 motion. Finally, we develop the equivalent circuit model of the AFM-TM microcantilever beam and perform related software simulations, along with practical circuit experiments. Our experimental results indicate that the constructed equivalent circuit can effectively analyze the dynamic characteristics of the AFM-TM microcantilever beam system in the presence of complex external environmental factors. It is observed that the practical circuit simulation attenuates high-frequency signals, resulting in a 31.4% reduction in excitation amplitude compared to numerical simulation results. This provides an essential theoretical foundation for selecting external excitation parameters for AFM-TM cantilever beams and offers a novel method for analyzing the dynamics of micro- and nanomechanical systems, as well as other nonlinear systems. Full article
(This article belongs to the Section Physical Sensors)
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18 pages, 11226 KB  
Article
Hyperelastic Microcantilever AFM: Efficient Detection Mechanism Based on Principal Parametric Resonance
by Amin Alibakhshi, Sasan Rahmanian, Shahriar Dastjerdi, Mohammad Malikan, Behrouz Karami, Bekir Akgöz and Ömer Civalek
Nanomaterials 2022, 12(15), 2598; https://doi.org/10.3390/nano12152598 - 28 Jul 2022
Cited by 6 | Viewed by 2416
Abstract
The impetus of writing this paper is to propose an efficient detection mechanism to scan the surface profile of a micro-sample using cantilever-based atomic force microscopy (AFM), operating in non-contact mode. In order to implement this scheme, the principal parametric resonance characteristics of [...] Read more.
The impetus of writing this paper is to propose an efficient detection mechanism to scan the surface profile of a micro-sample using cantilever-based atomic force microscopy (AFM), operating in non-contact mode. In order to implement this scheme, the principal parametric resonance characteristics of the resonator are employed, benefiting from the bifurcation-based sensing mechanism. It is assumed that the microcantilever is made from a hyperelastic material, providing large deformation under small excitation amplitude. A nonlinear strain energy function is proposed to capture the elastic energy stored in the flexible component of the device. The tip–sample interaction is modeled based on the van der Waals non-contact force. The nonlinear equation governing the AFM’s dynamics is established using the extended Hamilton’s principle, obeying the Euler–Bernoulli beam theory. As a result, the vibration behavior of the system is introduced by a nonlinear equation having a time-dependent boundary condition. To capture the steady-state numerical response of the system, a developed Galerkin method is utilized to discretize the partial differential equation to a set of nonlinear ordinary differential equations (ODE) that are solved by the combination of shooting and arc-length continuation method. The output reveals that while the resonator is set to be operating near twice the fundamental natural frequency, the response amplitude undergoes a significant drop to the trivial stable branch as the sample’s profile experiences depression in the order of the picometer. According to the performed sensitivity analysis, the proposed working principle based on principal parametric resonance is recommended to design AFMs with ultra-high detection resolution for surface profile scanning. Full article
(This article belongs to the Special Issue Mechanics of Micro- and Nano-Size Materials and Structures)
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17 pages, 1422 KB  
Article
Processing and Analysis of Long-Range Scans with an Atomic Force Microscope (AFM) in Combination with Nanopositioning and Nanomeasuring Technology for Defect Detection and Quality Control
by Ingo Ortlepp, Jaqueline Stauffenberg and Eberhard Manske
Sensors 2021, 21(17), 5862; https://doi.org/10.3390/s21175862 - 31 Aug 2021
Cited by 14 | Viewed by 3393
Abstract
This paper deals with a planar nanopositioning and -measuring machine, the so-called nanofabrication machine (NFM-100), in combination with a mounted atomic force microscope (AFM). This planar machine has a circular moving range of 100 mm. Due to the possibility of detecting structures in [...] Read more.
This paper deals with a planar nanopositioning and -measuring machine, the so-called nanofabrication machine (NFM-100), in combination with a mounted atomic force microscope (AFM). This planar machine has a circular moving range of 100 mm. Due to the possibility of detecting structures in the nanometre range with an atomic force microscope and the large range of motion of the NFM-100, structures can be analysed with high resolution and precision over large areas by combining the two systems, which was not possible before. On the basis of a grating sample, line scans over lengths in the millimetre range are demonstrated on the one hand; on the other hand, the accuracy as well as various evaluation methods are discussed and analysed. Full article
(This article belongs to the Special Issue Cantilever Sensors for Industrial Applications)
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14 pages, 5569 KB  
Article
Performance of an Electrothermal MEMS Cantilever Resonator with Fano-Resonance Annoyance under Cigarette Smoke Exposure
by Andi Setiono, Michael Fahrbach, Alexander Deutschinger, Ernest J. Fantner, Christian H. Schwalb, Iqbal Syamsu, Hutomo Suryo Wasisto and Erwin Peiner
Sensors 2021, 21(12), 4088; https://doi.org/10.3390/s21124088 - 14 Jun 2021
Cited by 11 | Viewed by 3903
Abstract
An electrothermal piezoresistive cantilever (EPC) sensor is a low-cost MEMS resonance sensor that provides self-actuating and self-sensing capabilities. In the platform, which is of MEMS-cantilever shape, the EPC sensor offers several advantages in terms of physical, chemical, and biological sensing, e.g., high sensitivity, [...] Read more.
An electrothermal piezoresistive cantilever (EPC) sensor is a low-cost MEMS resonance sensor that provides self-actuating and self-sensing capabilities. In the platform, which is of MEMS-cantilever shape, the EPC sensor offers several advantages in terms of physical, chemical, and biological sensing, e.g., high sensitivity, low cost, simple procedure, and quick response. However, a crosstalk effect is generated by the coupling of parasitic elements from the actuation part to the sensing part. This study presents a parasitic feedthrough subtraction (PFS) method to mitigate a crosstalk effect in an electrothermal piezoresistive cantilever (EPC) resonance sensor. The PFS method is employed to identify a resonance phase that is, furthermore, deployed to a phase-locked loop (PLL)-based system to track and lock the resonance frequency of the EPC sensor under cigarette smoke exposure. The performance of the EPC sensor is further evaluated and compared to an AFM-microcantilever sensor and a commercial particle counter (DC1100-PRO). The particle mass–concentration measurement result generated from cigarette-smoke puffs shows a good agreement between these three detectors. Full article
(This article belongs to the Special Issue Cantilever Sensors for Industrial Applications)
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3 pages, 528 KB  
Proceeding Paper
Investigations on Long-Range AFM Scans Using a Nanofabrication Machine (NFM-100)
by Jaqueline Stauffenberg, Ingo Ortlepp, Christoph Reuter, Mathias Holz, Denis Dontsov, Christoph Schäffel, Steffen Strehle, Jens-Peter Zöllner, Ivo W. Rangelow and Eberhard Manske
Proceedings 2020, 56(1), 34; https://doi.org/10.3390/proceedings2020056034 - 30 Dec 2020
Cited by 1 | Viewed by 1615
Abstract
The focus of this work lies on investigations on a new Nano Fabrication Machine (NFM-100) with a mounted atomic force microscope (AFM). This installed tip-based measuring system uses self-sensing and self-actuated microcantilevers, which can be used especially for field-emission scanning probe lithography (FESPL). [...] Read more.
The focus of this work lies on investigations on a new Nano Fabrication Machine (NFM-100) with a mounted atomic force microscope (AFM). This installed tip-based measuring system uses self-sensing and self-actuated microcantilevers, which can be used especially for field-emission scanning probe lithography (FESPL). The NFM-100 has a positioning range of Ø 100 mm, which offers, in combination with the tip-based measuring system, the possibility to analyse structures over long ranges. Using different gratings, the accuracy and the reproducibility of the NFM-100 and the AFM-system will be shown. Full article
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39 pages, 12154 KB  
Review
Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy
by Bernard Ouma Alunda and Yong Joong Lee
Sensors 2020, 20(17), 4784; https://doi.org/10.3390/s20174784 - 25 Aug 2020
Cited by 50 | Viewed by 18400
Abstract
This review critically summarizes the recent advances of the microcantilever-based force sensors for atomic force microscope (AFM) applications. They are one the most common mechanical spring–mass systems and are extremely sensitive to changes in the resonant frequency, thus finding numerous applications especially for [...] Read more.
This review critically summarizes the recent advances of the microcantilever-based force sensors for atomic force microscope (AFM) applications. They are one the most common mechanical spring–mass systems and are extremely sensitive to changes in the resonant frequency, thus finding numerous applications especially for molecular sensing. Specifically, we comment on the latest progress in research on the deflection detection systems, fabrication, coating and functionalization of the microcantilevers and their application as bio- and chemical sensors. A trend on the recent breakthroughs on the study of biological samples using high-speed atomic force microscope is also reported in this review. Full article
(This article belongs to the Special Issue Cantilever-Based Sensors)
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11 pages, 2531 KB  
Article
Gradient Estimator-Based Amplitude Estimation for Dynamic Mode Atomic Force Microscopy: Small-Signal Modeling and Tuning
by Hafiz Ahmed and Mohamed Benbouzid
Sensors 2020, 20(9), 2703; https://doi.org/10.3390/s20092703 - 9 May 2020
Cited by 6 | Viewed by 2641
Abstract
Atomic force microscopy (AFM) plays an important role in nanoscale imaging application. AFM works by oscillating a microcantilever on the surface of the sample being scanned. In this process, estimating the amplitude of the cantilever deflection signal plays an important role in characterizing [...] Read more.
Atomic force microscopy (AFM) plays an important role in nanoscale imaging application. AFM works by oscillating a microcantilever on the surface of the sample being scanned. In this process, estimating the amplitude of the cantilever deflection signal plays an important role in characterizing the topography of the surface. Existing approaches on this topic either have slow dynamic response e.g., lock-in-amplifier or high computational complexity e.g., Kalman filter. In this context, gradient estimator can be considered as a trade-off between fast dynamic response and high computational complexity. However, no constructive tuning rule is available in the literature for gradient estimator. In this paper, we consider small-signal modeling and tuning of gradient estimator. The proposed approach greatly simplifies the tuning procedure. Numerical simulation and experimental results are provided to demonstrate the suitability of the proposed tuning procedure. Full article
(This article belongs to the Section Physical Sensors)
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13 pages, 25125 KB  
Article
Experimental Setup for Dynamic Analysis of Micro- and Nano-Mechanical Systems in Vacuum, Gas, and Liquid
by Bram van den Brink, Farbod Alijani and Murali Krishna Ghatkesar
Micromachines 2019, 10(3), 162; https://doi.org/10.3390/mi10030162 - 26 Feb 2019
Cited by 3 | Viewed by 3819
Abstract
An experimental setup to perform dynamic analysis of a micro- and nano-mechanical system in vacuum, gas, and liquid is presented. The setup mainly consists of a piezoelectric excitation part and the chamber that can be either evacuated for vacuum, or filled with gas [...] Read more.
An experimental setup to perform dynamic analysis of a micro- and nano-mechanical system in vacuum, gas, and liquid is presented. The setup mainly consists of a piezoelectric excitation part and the chamber that can be either evacuated for vacuum, or filled with gas or water. The design of the piezoelectric actuator was based on a Langevin transducer. The chamber is made out of materials that can sustain: vacuum, variety of gases and different types of liquids (mild acids, alkalies, common alcohols and oils). All the experiments were performed on commercial cantilevers used for contact and tapping mode Atomic Force Microscopy (AFM) with stiffness 0.2 N/m and 48 N/m, respectively, in vacuum, air and water. The performance of the setup was evaluated by comparing the measured actuator response to a finite element model. The frequency responses of the two AFM cantilevers measured were compared to analytical equations. A vacuum level of 0.6 mbar was obtained. The setup has a bandwidth of 10–550 kHz in vacuum and air, and a bandwidth of 50–550 kHz in liquid. The dynamic responses of the cantilevers show good agreement with theory in all media. Full article
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25 pages, 1630 KB  
Article
Measurement and Evaluation of the Gas Density and Viscosity of Pure Gases and Mixtures Using a Micro-Cantilever Beam
by Anastasios Badarlis, Axel Pfau and Anestis Kalfas
Sensors 2015, 15(9), 24318-24342; https://doi.org/10.3390/s150924318 - 22 Sep 2015
Cited by 26 | Viewed by 8876
Abstract
Measurement of gas density and viscosity was conducted using a micro-cantilever beam. In parallel, the validity of the proposed modeling approach was evaluated. This study also aimed to widen the database of the gases on which the model development of the micro-cantilever beams [...] Read more.
Measurement of gas density and viscosity was conducted using a micro-cantilever beam. In parallel, the validity of the proposed modeling approach was evaluated. This study also aimed to widen the database of the gases on which the model development of the micro-cantilever beams is based. The density and viscosity of gases are orders of magnitude lower than liquids. For this reason, the use of a very sensitive sensor is essential. In this study, a micro-cantilever beam from the field of atomic force microscopy was used. Although the current cantilever was designed to work with thermal activation, in the current investigation, it was activated with an electromagnetic force. The deflection of the cantilever beam was detected by an integrated piezo-resistive sensor. Six pure gases and sixteen mixtures of them in ambient conditions were investigated. The outcome of the investigation showed that the current cantilever beam had a sensitivity of 240 Hz/(kg/m3), while the accuracy of the determined gas density and viscosity in ambient conditions reached ±1.5% and ±2.0%, respectively. Full article
(This article belongs to the Section Physical Sensors)
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23 pages, 731 KB  
Review
Atomic Force Microscopy as a Tool Applied to Nano/Biosensors
by Clarice Steffens, Fabio L. Leite, Carolina C. Bueno, Alexandra Manzoli and Paulo Sergio De Paula Herrmann
Sensors 2012, 12(6), 8278-8300; https://doi.org/10.3390/s120608278 - 14 Jun 2012
Cited by 71 | Viewed by 11932
Abstract
This review article discusses and documents the basic concepts and principles of nano/biosensors. More specifically, we comment on the use of Chemical Force Microscopy (CFM) to study various aspects of architectural and chemical design details of specific molecules and polymers and its influence [...] Read more.
This review article discusses and documents the basic concepts and principles of nano/biosensors. More specifically, we comment on the use of Chemical Force Microscopy (CFM) to study various aspects of architectural and chemical design details of specific molecules and polymers and its influence on the control of chemical interactions between the Atomic Force Microscopy (AFM) tip and the sample. This technique is based on the fabrication of nanomechanical cantilever sensors (NCS) and microcantilever-based biosensors (MC-B), which can provide, depending on the application, rapid, sensitive, simple and low-cost in situ detection. Besides, it can provide high repeatability and reproducibility. Here, we review the applications of CFM through some application examples which should function as methodological questions to understand and transform this tool into a reliable source of data. This section is followed by a description of the theoretical principle and usage of the functionalized NCS and MC-B technique in several fields, such as agriculture, biotechnology and immunoassay. Finally, we hope this review will help the reader to appreciate how important the tools CFM, NCS and MC-B are for characterization and understanding of systems on the atomic scale. Full article
(This article belongs to the Section Chemical Sensors)
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13 pages, 683 KB  
Article
Comparison between Conduction and Convection Effects on Self-Heating in Doped Microcantilevers
by Mohd Zahid Ansari and Chongdu Cho
Sensors 2012, 12(2), 1758-1770; https://doi.org/10.3390/s120201758 - 9 Feb 2012
Cited by 3 | Viewed by 5719
Abstract
The present study investigates the effects of thermal conduction and convection on self-heating temperatures and bimetallic deflections produced in doped microcantilever sensors. These cantilevers are commonly used as sensors and actuators in microsystems. The cantilever is a monolith, multi-layer structure with a thin [...] Read more.
The present study investigates the effects of thermal conduction and convection on self-heating temperatures and bimetallic deflections produced in doped microcantilever sensors. These cantilevers are commonly used as sensors and actuators in microsystems. The cantilever is a monolith, multi-layer structure with a thin U-shaped element inside. The cantilever substrate is made of silicon and silicon dioxide, respectively, and the element is p-doped silicon. A numerical analysis package (ANSYS) is used to study the effect of cantilever substrate material, element width, applied voltage and the operating environments on cantilever characteristics. The numerical results for temperature are compared against their analytical models. Results indicate the numerical results are accurate within 6% of analytical, and Si/Si cantilevers are more suitable for biosensors and AFM, whereas, Si/SiO2 are for hotplates and actuators applications. Full article
(This article belongs to the Section Biosensors)
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21 pages, 522 KB  
Article
Nonlinear Dynamics and Chaos of Microcantilever-Based TM-AFMs with Squeeze Film Damping Effects
by Wen-Ming Zhang, Guang Meng, Jian-Bin Zhou and Jie-Yu Chen
Sensors 2009, 9(5), 3854-3874; https://doi.org/10.3390/s90503854 - 20 May 2009
Cited by 38 | Viewed by 13021
Abstract
In Atomic force microscope (AFM) examination of a vibrating microcantilever, the nonlinear tip-sample interaction would greatly influence the dynamics of the cantilever. In this paper, the nonlinear dynamics and chaos of a tip-sample dynamic system being run in the tapping mode (TM) were [...] Read more.
In Atomic force microscope (AFM) examination of a vibrating microcantilever, the nonlinear tip-sample interaction would greatly influence the dynamics of the cantilever. In this paper, the nonlinear dynamics and chaos of a tip-sample dynamic system being run in the tapping mode (TM) were investigated by considering the effects of hydrodynamic loading and squeeze film damping. The microcantilever was modeled as a spring-mass-damping system and the interaction between the tip and the sample was described by the Lennard-Jones (LJ) potential. The fundamental frequency and quality factor were calculated from the transient oscillations of the microcantilever vibrating in air. Numerical simulations were carried out to study the coupled nonlinear dynamic system using the bifurcation diagram, Poincaré maps, largest Lyapunov exponent, phase portraits and time histories. Results indicated the occurrence of periodic and chaotic motions and provided a comprehensive understanding of the hydrodynamic loading of microcantilevers. It was demonstrated that the coupled dynamic system will experience complex nonlinear oscillation as the system parameters change and the effect of squeeze film damping is not negligible on the micro-scale. Full article
(This article belongs to the Special Issue Modeling, Testing and Reliability Issues in MEMS Engineering - 2009)
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