- Article
Study on the XPS-ESCA of Aluminum Phosphide Products
- Canping Pan,
- Weixi Li and
- Shuren Jiang
XPS-ESCA analysis showed small signal for phosphorus in fresh specimens of aluminum phosphide (AlP). After removal of a layer of about 0.5 – 1.0 μm by argon ion sputtering, it was observed that signal intensities from oxygen and aluminum increased. T...

