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Volume 13
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10.3390/electronics13091627
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Correction to Electronics 2023, 12(4), 862.
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Correction

Correction: Srinivasan et al. Detection and Grade Classification of Diabetic Retinopathy and Adult Vitelliform Macular Dystrophy Based on Ophthalmoscopy Images. Electronics 2023, 12, 862

by
Saravanan Srinivasan
1,
Rajalakshmi Nagarnaidu Rajaperumal
1,
Sandeep Kumar Mathivanan
2,
Prabhu Jayagopal
2,
Sujatha Krishnamoorthy
3,4,* and
Seifedine Kardy
5,6,7
1
Department of Computer Science and Engineering, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology, Chennai 600062, India
2
School of Information Technology and Engineering, Vellore Institute of Technology, Vellore 632014, India
3
Zhejiang Bioinformatics International Science and Technology Cooperation Center, Wenzhou-Kean University, Wenzhou 325060, China
4
Wenzhou Municipal Key Lab of Applied Biomedical and Biopharmaceutical Informatics, Wenzhou Kean University, Wenzhou 325060, China
5
Department of Applied Data Science, Noroff University College, 4612 Kristiansand, Norway
6
Artificial Intelligence Research Center (AIRC), Ajman University, Ajman 346, United Arab Emirates
7
Department of Electrical and Computer Engineering, Lebanese American University, Byblos P.O. Box 13-5053, Lebanon
*
Author to whom correspondence should be addressed.
Electronics 2024, 13(9), 1627; https://doi.org/10.3390/electronics13091627
Submission received: 9 April 2024 / Accepted: 11 April 2024 / Published: 24 April 2024
Versions Notes
There was an error in the original publication [1]. In the revised article, the “we” statement has been replaced by the author’s name. A correction has been made to Section 2 Related Works, paragraph 1 and Section 3.1 Dataset Availability, paragraph 1:
Section 2, Related Work, paragraph 1, sentence 14: During the course of their research, Sivaparthipan et al. constructed a deep learning model with the goal of identifying general abnormalities as well as particular diagnoses on MRI scans [22].
Section 2, Related Work, paragraph 1, sentence 24: Nguyen et al. proposed a depth-based palm biometric identification solution.
Section 2, Related Work, paragraph 1, sentence 28: In this paper, Jin et al. used a set of data called the Fundus Image Vessel Evaluation Set (FIVES) for their research.
Section 3.1, Dataset Availability, paragraph 1, sentence 1: In this paper, we utilized data from the publicly available DeepDRiD dataset, which can be accessed online.
The authors state that the scientific conclusions are unaffected. This correction was approved by the Academic Editor. The original publication has also been updated.

Reference

  1. Srinivasan, S.; Nagarnaidu Rajaperumal, R.; Mathivanan, S.K.; Jayagopal, P.; Krishnamoorthy, S.; Kardy, S. Detection and Grade Classification of Diabetic Retinopathy and Adult Vitelliform Macular Dystrophy Based on Ophthalmoscopy Images. Electronics 2023, 12, 862. [Google Scholar] [CrossRef]
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MDPI and ACS Style

Srinivasan, S.; Nagarnaidu Rajaperumal, R.; Kumar Mathivanan, S.; Jayagopal, P.; Krishnamoorthy, S.; Kardy, S. Correction: Srinivasan et al. Detection and Grade Classification of Diabetic Retinopathy and Adult Vitelliform Macular Dystrophy Based on Ophthalmoscopy Images. Electronics 2023, 12, 862. Electronics 2024, 13, 1627. https://doi.org/10.3390/electronics13091627

AMA Style

Srinivasan S, Nagarnaidu Rajaperumal R, Kumar Mathivanan S, Jayagopal P, Krishnamoorthy S, Kardy S. Correction: Srinivasan et al. Detection and Grade Classification of Diabetic Retinopathy and Adult Vitelliform Macular Dystrophy Based on Ophthalmoscopy Images. Electronics 2023, 12, 862. Electronics. 2024; 13(9):1627. https://doi.org/10.3390/electronics13091627

Chicago/Turabian Style

Srinivasan, Saravanan, Rajalakshmi Nagarnaidu Rajaperumal, Sandeep Kumar Mathivanan, Prabhu Jayagopal, Sujatha Krishnamoorthy, and Seifedine Kardy. 2024. "Correction: Srinivasan et al. Detection and Grade Classification of Diabetic Retinopathy and Adult Vitelliform Macular Dystrophy Based on Ophthalmoscopy Images. Electronics 2023, 12, 862" Electronics 13, no. 9: 1627. https://doi.org/10.3390/electronics13091627

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