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Journal: Electronics, 2018
Volume: 7
Number: 377

Article: A Comprehensive Review of Recent Progress on GaN High Electron Mobility Transistors: Devices, Fabrication and Reliability
Authors: by Fanming Zeng, Judy Xilin An, Guangnan Zhou, Wenmao Li, Hui Wang, Tianli Duan, Lingli Jiang and Hongyu Yu
Link: https://www.mdpi.com/2079-9292/7/12/377

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