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Applied Sciences
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Recent Development of Quantum Sensing and Metrology
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Recent Development of Quantum Sensing and Metrology

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Quantum Science and Technology".

Deadline for manuscript submissions: closed (30 June 2021) | Viewed by 5548

Special Issue Editor

Dr. Changhyoup Lee

E-Mail Website
Guest Editor
Institute of Theoretical Solid State Physics, Karlsruhe Institute of Technology, Karlsruhe, Baden-Württemberg, Germany
Interests: quantum metrology; applied quantum sensing and imaging; quantum nanophotonics; quantum state and measurement engineering; photon scattering; quantum information

Special Issue Information

Dear Colleagues,

Quantum sensing and metrology aims to achieve precision beyond the standard quantum limit in parameter estimation. In recent years, the techniques that exhibit quantum enhancement in sensing and imaging have been intensively and extensively developed in diverse areas for various purposes.

The present Special Issue is devoted to bringing together recent studies on quantum sensing and metrology from both theoretical and experimental perspectives. For this Special Issue, we invite researchers to submit comprehensive review papers and original research articles covering all aspects of quantum sensing, metrology, imaging, illumination, and parameter estimation. I look forward to receiving your excellent contribution to this Special Issue.

Dr. Changhyoup Lee
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • quantum metrology
  • quantum sensing
  • quantum imaging
  • quantum illumination
  • quantum parameter estimation

Published Papers (2 papers)

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Research

17 pages, 846 KiB  
Article
Robust Phase Estimation of Gaussian States in the Presence of Outlier Quantum States
by Yukito Mototake and Jun Suzuki
Appl. Sci. 2020, 10(16), 5475; https://doi.org/10.3390/app10165475 - 7 Aug 2020
Viewed by 1988
Abstract
In this paper, we investigate the problem of estimating the phase of a coherent state in the presence of unavoidable noisy quantum states. These unwarranted quantum states are represented by outlier quantum states in this study. We first present a statistical framework of [...] Read more.
In this paper, we investigate the problem of estimating the phase of a coherent state in the presence of unavoidable noisy quantum states. These unwarranted quantum states are represented by outlier quantum states in this study. We first present a statistical framework of robust statistics in a quantum system to handle outlier quantum states. We then apply the method of M-estimators to suppress untrusted measurement outcomes due to outlier quantum states. Our proposal has the advantage over the classical methods in being systematic, easy to implement, and robust against occurrence of noisy states. Full article
(This article belongs to the Special Issue Recent Development of Quantum Sensing and Metrology)
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18 pages, 2351 KiB  
Article
Optical Wave Guiding and Spectral Properties of Micro/Nanofibers Used for Quantum Sensing and Quantum Light Generation
by Yong Sup Ihn, Zaeill Kim and Su-Yong Lee
Appl. Sci. 2020, 10(2), 715; https://doi.org/10.3390/app10020715 - 20 Jan 2020
Viewed by 2700
Abstract
Subwavelength optical micro/nanofibers have been widely used as basic building blocks in the field of quantum sensing and quantum light source by virtue of their properties which include pronounced evanescent field, large surface area, and small optical mode area. This paper presents theoretical [...] Read more.
Subwavelength optical micro/nanofibers have been widely used as basic building blocks in the field of quantum sensing and quantum light source by virtue of their properties which include pronounced evanescent field, large surface area, and small optical mode area. This paper presents theoretical studies on the propagation properties of the guided optical wave and the spectral properties of entangled photons from spontaneous four-wave mixing in micro/nanofibers. We first analyze numerically single-mode propagation, field distribution, fraction of power, and group-velocity-dispersions by solving Maxwell’s equations with boundary conditions in cylindrical coordinates. Then, optical wave guiding properties of micro/nanofibers are applied to estimate the spectral properties such as central wavelengths and bandwidths of the created photons via spontaneous four-wave mixing that can be tailored by controlling diameter and length of micro/nanofibers. This theoretical work provides useful guidelines to design micro/nanofiber-based quantum sensing and quantum light sources for quantum technologies. Full article
(This article belongs to the Special Issue Recent Development of Quantum Sensing and Metrology)
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