Reliability Analysis of Electrotechnical Devices, 2nd Edition

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Applied Industrial Technologies".

Deadline for manuscript submissions: closed (30 November 2022) | Viewed by 176

Special Issue Editor


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Guest Editor
Center of Reliability Sciences and Technologies, Chang Gung University, Wenhua 1st Rd., Guishan Dist., Taoyuan City 33302, Taiwan
Interests: reliability modeling; reliability statistics; failure analysis; prognosis and health management; reliability simulation
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Special Issue Information

Dear Colleagues,

Smart Worlds involve complex electrotechnical systems and devices, and they have improved our living significantly. Consequently, we are heavily dependent on them, and their reliability is crucial. However, ensuring the reliability of complex systems and devices can be challenging, especially when attempting to do so in a cost-effective manner. This Special Issue focuses on various methods and examples to improve, evaluate, and predict reliability of the electrotechnical systems and devices that constitute smart systems and Smart Worlds.

Topics of interest to be covered by this Special Issue include but are not limited to reliability and as well as to the following topics regarding electrotechnical systems and devices:

  • Electron devices;
  • Electro-optical devices;
  • Batteries and packs;
  • MEMS and NEMS;
  • Vacuum devices;
  • Renewable energy devices and systems;
  • Bio-medical electronic devices;
  • Wearable devices and systems;
  • Automotive electronic devices;
  • Electrical energy systems;
  • Engineering system maintenance;
  • Nano-electronic devices and systems.

Prof. Dr. Cher Ming Tan
Guest Editor

Manuscript Submission Information

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Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • reliability
  • durability
  • maintenance
  • availability
  • risk
  • safety
  • electron devices
  • electro-optical devices
  • batteries and packs
  • MEMS and NEMS
  • vacuum devices
  • renewable energy devices and systems
  • bio-medical electronic devices
  • wearable devices and systems
  • automotive electronic devices
  • electrical energy systems
  • engineering system maintenance
  • nano-electronic devices and systems

Published Papers

There is no accepted submissions to this special issue at this moment.
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