Diffractive Imaging of Crystalline Materials at XFELs and Synchrotrons
A special issue of Crystals (ISSN 2073-4352). This special issue belongs to the section "Crystal Engineering".
Deadline for manuscript submissions: 28 June 2024 | Viewed by 2414
Special Issue Editors
Interests: XFEL; serial femtosecond crystallography (SFX); coherent diffractive imaging; X-ray holography and diffraction microscopy
Special Issue Information
Dear Colleagues,
Crystals, one of the most common forms of matter, are extremely fascinating and have been the focus of studies for centuries even before the birth of crystallography. Since the first X-ray diffraction experiments and the subsequent molecular structure determination from crystals in the early twentieth century, X-ray science and technologies have advanced dramatically over the past hundred years. The scientific community has witnessed and benefitted from the birth of large-scale brighter x-ray facilities like synchrotrons and more recently, the x-ray free-electron lasers (XFELs) in the last two decades. Meanwhile, along with crystallography, ultrafast diffractive imaging has emerged as a powerful technique providing unprecedented insights into the structure and dynamics of matter. With the rapid advancements in the design and capabilities of synchrotrons and XFELs, and with the advancements in the field of diffractive imaging, there is a significant interest among the community in condensing the recent knowledge on diffractive imaging of the structure and dynamics of crystalline materials at synchrotrons and XFELs. To realize this, we invite you—the scientific community, friends and colleagues, to contribute to this Special Issue focusing on “Diffractive Imaging of Crystalline Materials at XFELs and Synchrotrons”.
The scope of this Special Issue spans several aspects of coherent diffractive imaging (CDI) of crystals with a focus on nanoscale crystalline materials. The topics covered are serial/single-crystal diffractive imaging of macromolecular/inorganic materials (e.g.: serial macromolecular crystallography, fiber-diffraction, grain-mapping in case of inorganic nanocrystals), instrumentation and sample delivery for diffractive imaging, Bragg-CDI, ptychography, holography, x-ray microscopy, projection imaging, fluctuation imaging, and ultrafast pump-probe diffractive imaging of nanocrystals, data processing for high repetition rate XFELs including the development of software and algorithms including machine learning methods. Your contribution could either be a review article condensing the recent signs of progress in these areas or a perspective focusing on future developments of a specific technique or a class of crystalline materials or even a facility/instrument, or it could be a rapid communication/full-article with original theoretical or experimental research results!
Note: As this Special Issue focuses exclusively on crystalline materials and within the scope of the journal, articles on diffractive imaging of non-crystalline materials are not covered; however, the potential of extension of crystallographic methods to imaging non-crystalline materials can be discussed briefly in your submissions.
The submission deadline is July 31, 2023. Please get in touch with us, should you have any questions on this Special Issue!
Looking forward to receiving your contributions!
Dr. Chufeng Li
Dr. Andrew V. Martin
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Crystals is an international peer-reviewed open access monthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- diffractive imaging
- macromolecular, organic, and inorganic crystals
- quasicrystals
- liquid crystals
- fiber diffraction
- serial crystallography
- data processing in diffractive imaging
- holography of crystalline materials
- sample delivery for diffractive imaging
- free electron laser, X-ray diffraction, ultra-fast X-ray diffraction, serial femto-second crystallography, coherent diffractive imaging, X-ray diffraction microscopy, 3-dimensional X-ray diffraction (3DXRD)
- grain orientation mapping, diffraction contrast tomography(DCT
- X-ray topography
- Bragg coherent diffractive imaging (BCDI)
- Bragg ptychography
- high volume and throughput data analysis
- machine learning
- multigrain crystallography
- diffraction data analysis
Planned Papers
The below list represents only planned manuscripts. Some of these manuscripts have not been received by the Editorial Office yet. Papers submitted to MDPI journals are subject to peer-review.
Title: Fiber Diffraction at XFELs and Synchrotrons
Authors: Paul Lourdu Xavier
Affiliation: 1.Center for Free-Electron Laser Science DESY, Hamburg, Germany
2.Max Planck Institute for the Structure and Dynamics of Matter, Hamburg, Germany
Title: Diffractive Imaging of Inorganic Nanocrystals at XFELs and Synchrotrons
Authors: Paul Lourdu Xavier; Chufeng Li
Affiliation: 1.Center for Free-Electron Laser Science DESY, Hamburg, Germany
2.Max Planck Institute for the Structure and Dynamics of Matter, Hamburg, Germany
Title: EXtra-Xwiz: a tool to streamline serial femtosecond crystallography workflows at European XFEL
Authors: Oleksii Turkot; Fabio Dall’Antonia; Richard J. Bean; Juncheng E; Hans Fangohr; Danilo E. Ferreira de Lima; Sravya Kantamneni; Henry Kirkwood; Faisal H. M. Koua; Adrian P. Mancuso[*]; Diogo Melo; Adam Round; Egor Sobolev; Raphael de Wijn; James J. Wrigley; Luca Gelisio
Affiliation: [all] European XFEL GmbH, Holzkoppel 4, 22069 Schenefeld, Germany.
[*] La Trobe Institute for Molecular Science, Melbourne, VIC 3086, Australia.
Abstract: X-ray free electron lasers deliver photon pulses which are bright enough to observe diffraction from extremely small crystals, at a time scale outrunning their destruction. As crystals are continuously replaced, this technique is termed serial femtosecond crystallography (SFX). Due to its high pulse repetition rate, the European XFEL enables the collection of rich and extensive data sets, suited to study various scientific problems including ultrafast processes. The enormous data rate, data complexity, and the nature of the pixelized multi-modular area detectors at European XFEL pose severe challenges to users.
To streamline the analysis of SFX data, we developed the semi-automated pipeline EXtra-Xwiz around the established CrystFEL program suite, processing diffraction patterns on detector frames into structure factors.
