Machine Learning Techniques for Image Processing

A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Computer Science & Engineering".

Deadline for manuscript submissions: 16 November 2024 | Viewed by 1296

Special Issue Editors


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Winston Chung Global Energy Center (WCGEC), University of California Riverside, Riverside, CA 92521, USA
Interests: machine learning; image processing; signal processing; computer sciences; artificial intelligence; pattern recognition
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Electrical Engineering and Computer Science, Embry-Riddle Aeronautical University, Daytona Beach, FL 32114, USA
Interests: computer engineering; cyber–physical systems; software defined networks
Special Issues, Collections and Topics in MDPI journals

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College of Engineering and Computer Science, University of Tennessee at Chattanooga, 615 McCallie Ave, Chattanooga, TN 37403, USA
Interests: robotics; mobile robotics; control systems; intelligent algorithms

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Guest Editor
Department of Computer Science, Florida Polytechnic University, Lakeland, FL 33805, USA
Interests: machine learning; augmented reality

Special Issue Information

Dear Colleagues,

Today, machine learning and image processing are applied in every field of science and technology.

In the real world, in addition to traditional image processing methods, there are machine learning algorithms for complex and diverse image data, data-driven approaches, and applications where models can learn from large amounts of labeled or unlabeled image data to automatically discover patterns, properties, and relationships.

Various machine learning techniques, such as convolutional neural networks, which are widely used in image processing and perform outstandingly in tasks such as image classification, object detection, and semantic segmentation, find wide-ranging applications in industry, health, agriculture, finance, and social sciences. Studies related to industrial, biomedical data applications, autonomous vehicle and drone technologies, agriculture and cartography, computational sciences, finance, marketing and advertising are within the scope of this Special Issue, which hopes to be a platform to explore all machine learning-based applications.

In this Special Issue, original research articles and reviews are welcome. Research areas may include (but are not limited to) the following:

  • Medical science;
  • Biomedical science;
  • Statistics and mathematics;
  • Engineering/industrial systems;
  • Computer and computational sciences;
  • Electric, electronic, and mechatronic systems;
  • Autonomous vehicles;
  • Aviation and drone technologies;
  • Energy systems;
  • Material science;
  • Finance;
  • Marketing, advertising, and management;
  • Psychology;
  • Social media.

We look forward to receiving your contributions.

Dr. Tahir Cetin Akinci
Dr. Mustafa Ilhan Akbas
Dr. Gokhan Erdemir
Dr. Oguzhan Topsakal
Guest Editors

Manuscript Submission Information

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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • machine learning
  • deep learning
  • artificial neural networks
  • artificial intelligence

Published Papers (1 paper)

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Research

19 pages, 22377 KiB  
Article
Learning the Frequency Domain Aliasing for Real-World Super-Resolution
by Yukun Hao and Feihong Yu
Electronics 2024, 13(2), 250; https://doi.org/10.3390/electronics13020250 - 5 Jan 2024
Viewed by 746
Abstract
Most real-world super-resolution methods require synthetic image pairs for training. However, the frequency domain gap between synthetic images and real-world images leads to artifacts and blurred reconstructions. This work points out that the main reason for the frequency domain gap is that aliasing [...] Read more.
Most real-world super-resolution methods require synthetic image pairs for training. However, the frequency domain gap between synthetic images and real-world images leads to artifacts and blurred reconstructions. This work points out that the main reason for the frequency domain gap is that aliasing exists in real-world images, but the degradation model used to generate synthetic images ignores the impact of aliasing on images. Therefore, a method is proposed in this work to assess aliasing in images undergoing unknown degradation by measuring the distance to their alias-free counterparts. Leveraging this assessment, a domain-translation framework is introduced to learn degradation from high-resolution to low-resolution images. The proposed framework employs a frequency-domain branch and loss function to generate synthetic images with aliasing features. Experiments validate that the proposed domain-translation framework enhances the visual quality and quantitative results compared to existing super-resolution models across diverse real-world image benchmarks. In summary, this work offers a practical solution to the real-world super-resolution problem by minimizing the frequency domain gap between synthetic and real-world images. Full article
(This article belongs to the Special Issue Machine Learning Techniques for Image Processing)
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