Advances in Quantum Metrology
A special issue of Entropy (ISSN 1099-4300). This special issue belongs to the section "Quantum Information".
Deadline for manuscript submissions: closed (15 November 2018)
Special Issue Editors
Interests: atomic and molecular physics; Bose-Einstein condensation; quantum dynamics; quantum mechanics; quantum metrology; quantum optics and information; quantum theory
Special Issue Information
Dear Colleagues,
One of the most exciting recent developments in quantum physics has been the emergence of quantum-enhanced metrology, sensing and imaging. Together, these aim to make use of non-classical effects to estimate parameters or image objects with a precision beyond anything that could otherwise be achieved. Huge advances have been made recently in both experiments and theory and the field is rapidly maturing as a new quantum technology. The theory is well-established for single-parameter estimation and a number of experiments have demonstrated the advantages in practice. Attention is now turning to applications such as low-flux sensing of delicate samples, enhanced precision for gravitational wave detection, improved clocks, quantum radar and navigational systems and imaging beyond the diffraction limit. This Special Issue aims to bring together some of the latest advances in quantum metrology. These include new theoretical tools to understand the precision bounds for multiparameter estimation; networks of quantum sensors; practical implementations in atomic, optical and solid state systems; the metrological utility of phase transitions; and hybrid quantum-classical schemes, among others. A great strength of this field has been the strong interplay between experiment and theory and this Special Issue aims to report on important recent advances in both these areas.
Prof. Jacob A. DunninghamDr. Simon A. Haine
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Entropy is an international peer-reviewed open access monthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- quantum-enhanced metrology, sensing, and imaging
- entanglement-assisted parameter estimation
- Fisher information
- measurement precision bounds
- uncertainty relations
