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Preparation and Application of Conductive Materials

A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Materials Physics".

Deadline for manuscript submissions: 20 May 2024 | Viewed by 958

Special Issue Editors


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Guest Editor
Faculty of Automatic Control, Electronics and Computer Science, Silesian University of Technology, Gliwice, Poland
Interests: eddy current testing; electromagnetism; impedance analysis; analytical modeling

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Guest Editor
Graduate School of Environment and Information Sciences, Yokohama National University, Yokohama, Japan
Interests: nondestructive testing; development of sensor and monitoring system; risk assessment on technical system; material deterioration mechanism; failures and failure modes of materials
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Guest Editor
School of Aerospace Engineering, Xi’an Jiaotong University, Xi’an, China
Interests: non-destructive testing and evaluation; forward modelling and inversion for defect reconstruction; characterization and evaluation of structural defects; image/signal processing and feature extraction techniques

Special Issue Information

Dear Colleagues,

Considering that electrical and electronic devices are used almost everywhere, the rapid development of conductive materials is of great importance. Better conductive properties would reduce the cost, heat loss and dimensions of conductors. In light of this, the demand for high-quality conductive materials has accelerated in the modern industry.

We kindly invite you to submit manuscripts for this Special Issue entitled "Preparation and Application of Conductive Materials". Original research and critical review articles are all welcome. Papers which describe the recent advances in techniques regarding designing, manufacturing, processing, and characterizing conductive materials a the specific focus on all aspects of applications are also welcome.

The following are topics of interest:

  • carbon-based conductive materials (graphene, carbon black, graphite, carbon nanotubes);
  • metals, steels, alloys;
  • polymers, composites;
  • thin films, protective barriers and coatings;
  • materials of the future;
  • structure–properties relationship;
  • nanostructuration of conducting materials;
  • measurement, determination of parameters, geometric dimensions and properties;
  • identification, sorting and classification;
  • protection of conductive materials and prevention of corrosion;
  • destructive and nondestructive testing;
  • detection, imaging and quantitative assessment of structural defects in conductors;
  • material deterioration mechanism;
  • sensors and monitoring technologies of conductive materials.

Dr. Grzegorz Tytko
Dr. Naoya Kasai
Prof. Dr. Yong Li
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Materials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • conductive materials
  • metals
  • steels
  • alloys
  • carbon-based conductive materials
  • polymers
  • composites
  • corrosion
  • cracks
  • nondestructive testing

Published Papers (1 paper)

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Research

11 pages, 2509 KiB  
Article
Ellipsometric Study on the Uniformity of Al:ZnO Thin Films Deposited Using DC Sputtering at Room Temperature over Large Areas
by Cecilia Guillén and Juan Francisco Trigo
Materials 2023, 16(20), 6644; https://doi.org/10.3390/ma16206644 - 11 Oct 2023
Viewed by 603
Abstract
Al-doped ZnO combines high transparency and conductivity with abundant and non-toxic elements; making it suitable for optoelectronic devices with large-scale applications. In order to check the quality of the material deposited over large areas, spectroscopic ellipsometry is a powerful technique that allows the [...] Read more.
Al-doped ZnO combines high transparency and conductivity with abundant and non-toxic elements; making it suitable for optoelectronic devices with large-scale applications. In order to check the quality of the material deposited over large areas, spectroscopic ellipsometry is a powerful technique that allows the determination of various optical and electrical parameters by applying suitable oscillator models. This technique is used here to obtain sheet resistance and visible transmittance data at several equidistant points of Al:ZnO thin films deposited using DC sputtering on 15 cm × 15 cm glass substrates. Independent measurements using other optical (spectrophotometry) and electrical (four point probe) methods show analogous visible transmittance but somewhat higher resistance values than those obtained with ellipsometry, which is explained by the contribution of grain-boundary scattering compared to in-grain properties provided using ellipsometry. However, the mapping of the data gives a similar spatial distribution to the different types of measurement; therefore, proving the capacity of ellipsometry to study with a single tool the uniformity of the optical and electrical characteristics of large areas. Full article
(This article belongs to the Special Issue Preparation and Application of Conductive Materials)
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