Advances in Statistical Process Monitoring and Wavelet Analysis
A special issue of Mathematics (ISSN 2227-7390). This special issue belongs to the section "Probability and Statistics".
Deadline for manuscript submissions: 30 November 2024 | Viewed by 1501
Special Issue Editors
Interests: statistical process monitoring; wavelets analysis; statistical modeling; predictive modeling; data-driven methods; quality engineering; machine learning applicaitons
Special Issue Information
Dear Colleagues,
Applied mathematics and statistics methods have advanced considerably during the past decades, mainly as a result of the remarkable rise of computing and data abundance. Statistical process monitoring involves collecting data, learning from it, and developing data-driven models for monitoring purposes. Wavelet methods have become standard in applied mathematics and an effective tool for statistical monitoring, including dimension reduction, denoising, feature engineering for machine learning methods, time-frequency analysis, image processing, and signal processing. This Special Issue seeks new techniques and innovative applications in different statistical process monitoring settings, including in the fields of health monitoring, image monitoring, and profile monitoring, to name a few.
Dr. Achraf Cohen
Prof. Dr. Yichuan Zhao
Guest Editors
Manuscript Submission Information
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Keywords
- statistical process monitoring
- wavelet analysis
- control charts
- machine learning methods