Advanced Optical Microscopy and Imaging Technology

A special issue of Photonics (ISSN 2304-6732).

Deadline for manuscript submissions: 15 November 2024 | Viewed by 1204

Special Issue Editors


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Guest Editor
School of Medicine, Yale University, 333 Cedar Street, New Haven, CT 06510, USA
Interests: super-resolution microscopy; isoSTED; femtosecond lasers; nonlinear optical microscopy; label-free fluorescence microscopy; cartilage; second harmonic generation microscopy; spectroscopy; biophotonics
CLEMSON-MUSC Bioengineering Program, Clemson University, 68 President Street, Charleston, SC 29425, USA
Interests: deep tissue imaging; three-dimensional imaging of tissue functions; confocal microscopy; nonlinear optical microscopy; STED microscopy; label-free imaging; aberration correction; deep/machine learning; clinical imaging; osteoarthritis

Special Issue Information

Dear Colleagues,

The area of optical microscopy and imaging technology is ever-evolving to extend the ability of researchers to elucidate intricate biological structures and functions. This is a key area in biology, biophysics, and medicine. There are continued and unmet needs for deeper, faster, and higher-resolution imaging across a multitude of biological specimens. Technology advances in photonics, optical systems, fluorescence labeling methods, and sample preparations continue to drive many important discoveries.

This Special Issue, entitled “Advanced Optical Microscopy and Imaging Technology”, aims to compile significant research and review articles on a wide range of optical microscopy technologies and imaging applications that reflect the current development and future directions of the field. We are pleased to invite you to submit your manuscripts to this Special Issue. Topics include, but are not limited to, the following:

  • Advances in super-resolution microscopy: STED, single-molecule localization microscopy, structured illumination microscopy, MINSTED, MINFLUX, etc.;
  • Developments in nonlinear optical microscopy: two-photon, three-photon fluorescence microscopy, second harmonic and third harmonic generation microscopy, stimulated Raman scattering microscopy;
  • Technological advances and applications of light-sheet microscopy;
  • Novel fluorescence labeling and sample preparation methods or applications: e.g.,: expansion microscopy, pan-expansion microscopy, exchangeable fluorescent labeling;
  • Applications of adaptive optics in optical microscopy aberration correction;
  • Progress and developments in confocal microscopy, computational imaging, and phase contrast imaging;
  • Deep learning-aided microscopy implementation technology, for example, super-resolution microscopy, denoise, and aberration correction technology;
  • Developments in multimodal optical correlative imaging.

We look forward to receiving your contributions.

Dr. Yang Li
Dr. Tong Ye
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Photonics is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • super-resolution microscopy
  • expansion microscopy
  • exchangeable fluorescent labeling
  • light-sheet microscopy
  • computational imaging
  • structural illumination microscopy
  • nonlinear optical microscopy
  • deep learning

Published Papers (1 paper)

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Research

18 pages, 2242 KiB  
Article
Role of Phase Information Propagation in the Realisation of Super-Resolution Based on Speckle Interferometry
by Yasuhiko Arai
Photonics 2023, 10(12), 1306; https://doi.org/10.3390/photonics10121306 - 26 Nov 2023
Cited by 1 | Viewed by 630
Abstract
Super-resolution technology is important not only in bio-related fields but also in nanotechnology, particularly in the semiconductor industry, where fine patterning is required and super-resolution is essential. However, observing microstructures beyond the diffraction limit proposed by Abbe and Rayleigh is considered impossible because [...] Read more.
Super-resolution technology is important not only in bio-related fields but also in nanotechnology, particularly in the semiconductor industry, where fine patterning is required and super-resolution is essential. However, observing microstructures beyond the diffraction limit proposed by Abbe and Rayleigh is considered impossible because of diffraction in traditional optical microscopy observation techniques. However, in recent years, it has been possible to observe microstructures beyond the Rayleigh criterion by analysing the phase distribution of light. This study investigated the physical reasons why phase analysis makes this new analysis technique possible using simulations. The results confirmed that the phase component of the zero-order diffracted light reflected from the microstructure and able to pass through the lens system contained phase information related to the shape of the measured object. Analysis of this information demonstrates the possibility of realising super-resolution based on speckle interferometry. Full article
(This article belongs to the Special Issue Advanced Optical Microscopy and Imaging Technology)
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