Quantum Metrology

A special issue of Technologies (ISSN 2227-7080). This special issue belongs to the section "Quantum Technologies".

Deadline for manuscript submissions: closed (30 July 2016) | Viewed by 28237

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Department of Electrical and Computer Engineering and Physics, Boston University, Boston, MA 02215, USA
Interests: quantum information; quantum communication and cryptography; quantum networking; quantum imaging; linear-optical quantum computing
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Special Issue Information

Dear Colleagues,

The world is currently in the midst of a second quantum revolution. The first quantum revolution gave us new rules that govern physical reality. The second quantum revolution takes these rules and uses them to develop new technologies. The new technological prospects of processing quantum information, in communication, computation, imaging, and metrology, attract the interest of researchers from many scientific communities, such as physics, computer science, and electrical engineering. Many recent examples demonstrate that quantum phenomena, which usually appear to be surprising from the point of view of classical physics, may serve as an enabling technology to perform practical tasks much better than conventional classical approaches.

Quantum metrology uses the physical properties of quantum physical systems—photons and atoms—for setting standards defining units of measurement in science and industry, as well as for engineering other high-precision technologies. This area of modern science and technology concentrates on making high-resolution measurements of physical parameters using quantum theory to describe physical systems, particularly, by exploiting the effect of quantum entanglement. Quantum metrology uses quantum features to enhance precision, resolution, and sensitivity beyond classical limits when quantum mechanics sets the ultimate limit on the accuracy of any measurement. For example, quantum number-path entanglement is a resource for supersensitive quantum metrology and, in particular, provides for sub-shot-noise or even Heisenberg-limited sensitivity. One area where this will lead to significant advances is building new sensors that achieve an ultimate level of precision measurement and perform fundamentally better than their traditional classical counterparts.

This Special Issue will focus on the latest achievements in the rapidly growing field of quantum metrology with a particular emphasis on the most recent advances in areas of quantum and nonlinear optics, atomic physics, single-photon detection, advanced interferometry, spectroscopy, imaging, quantum communication, accurate transfer of time standards over large distance including satellites, and super-resolution sensing of the variety of physical parameters in science, engineering, and industry.

Prof. Alexander V. Sergienko
Guest Editor

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Keywords

  • quantum metrology
  • quantum measurement
  • quantum entanglement
  • quantum information
  • quantum sensors
  • quantum interferometry

Published Papers (4 papers)

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Research

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5317 KiB  
Article
Development of a CMOS Route for Electron Pumps to Be Used in Quantum Metrology
by Sylvain Barraud, Romain Lavieville, Louis Hutin, Heorhii Bohuslavskyi, Maud Vinet, Andrea Corna, Paul Clapera, Marc Sanquer and Xavier Jehl
Technologies 2016, 4(1), 10; https://doi.org/10.3390/technologies4010010 - 11 Mar 2016
Cited by 7 | Viewed by 5362
Abstract
The definition of the ampere will change in the next few years. This electrical base unit of the S.I. will be redefined by fixing the value of the charge quantum, i.e., the electron charge e. As a result electron pumps will [...] Read more.
The definition of the ampere will change in the next few years. This electrical base unit of the S.I. will be redefined by fixing the value of the charge quantum, i.e., the electron charge e. As a result electron pumps will become the natural device for the mise en pratique of this new ampere. In the last years semiconductor electron pumps have emerged as the most advanced systems, both in terms of speed and precision. Another figure of merit for a metrological device would be its ability to be predictible and shared. For that reason a mature fabrication process would certainly be an advantage. In this article we present electron pumps made within a CMOS (Complementary Metal Oxide Semiconductor) research facility on 300 mm silicon-on-insulator wafers, using advanced microelectronics tools and processes. We give an overview of the whole integration scheme and emphasize the fabrication steps which differ from the normal CMOS route. Full article
(This article belongs to the Special Issue Quantum Metrology)
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1732 KiB  
Article
Bright Single-Photon Sources Based on Anti-Reflection Coated Deterministic Quantum Dot Microlenses
by Peter Schnauber, Alexander Thoma, Christoph V. Heine, Alexander Schlehahn, Liron Gantz, Manuel Gschrey, Ronny Schmidt, Caspar Hopfmann, Benjamin Wohlfeil, Jan-Hindrick Schulze, André Strittmatter, Tobias Heindel, Sven Rodt, Ulrike Woggon, David Gershoni and Stephan Reitzenstein
Technologies 2016, 4(1), 1; https://doi.org/10.3390/technologies4010001 - 25 Dec 2015
Cited by 10 | Viewed by 8439
Abstract
We report on enhancing the photon-extraction efficiency (PEE) of deterministic quantum dot (QD) microlenses via anti-reflection (AR) coating. The AR-coating deposited on top of the curved microlens surface is composed of a thin layer of Ta2O5, and is found [...] Read more.
We report on enhancing the photon-extraction efficiency (PEE) of deterministic quantum dot (QD) microlenses via anti-reflection (AR) coating. The AR-coating deposited on top of the curved microlens surface is composed of a thin layer of Ta2O5, and is found to effectively reduce back-reflection of light at the semiconductor-vacuum interface. A statistical analysis of spectroscopic data reveals, that the AR-coating improves the light out-coupling of respective microlenses by a factor of 1.57 ± 0.71, in quantitative agreement with numerical calculations. Taking the enhancement factor into account, we predict improved out-coupling of light with a PEE of up to 50%. The quantum nature of emission from QDs integrated into AR-coated microlenses is demonstrated via photon auto-correlation measurements revealing strong suppression of two-photon emission events with g(2)(0) = 0.05 ± 0.02. As such, these bright non-classical light sources are highly attractive with respect to applications in the field of quantum cryptography. Full article
(This article belongs to the Special Issue Quantum Metrology)
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1994 KiB  
Review
Quantum Sensing of Noisy and Complex Systems under Dynamical Control
by Gershon Kurizki, Gonzalo A. Alvarez and Analia Zwick
Technologies 2017, 5(1), 1; https://doi.org/10.3390/technologies5010001 - 24 Dec 2016
Cited by 7 | Viewed by 5902
Abstract
We review our unified optimized approach to the dynamical control of quantum-probe interactions with noisy and complex systems viewed as thermal baths. We show that this control, in conjunction with tools of quantum estimation theory, may be used for inferring the spectral and [...] Read more.
We review our unified optimized approach to the dynamical control of quantum-probe interactions with noisy and complex systems viewed as thermal baths. We show that this control, in conjunction with tools of quantum estimation theory, may be used for inferring the spectral and spatial characteristics of such baths with high precision. This approach constitutes a new avenue in quantum sensing, dubbed quantum noise spectroscopy. Full article
(This article belongs to the Special Issue Quantum Metrology)
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6405 KiB  
Review
Single Atoms Preparation Using Light-Assisted Collisions
by Yin Hsien Fung, Pimonpan Sompet and Mikkel F. Andersen
Technologies 2016, 4(1), 4; https://doi.org/10.3390/technologies4010004 - 27 Jan 2016
Cited by 6 | Viewed by 7796
Abstract
The detailed control achieved over single optically trapped neutral atoms makes them candidates for applications in quantum metrology and quantum information processing. The last few decades have seen different methods developed to optimize the preparation efficiency of single atoms in optical traps. Here [...] Read more.
The detailed control achieved over single optically trapped neutral atoms makes them candidates for applications in quantum metrology and quantum information processing. The last few decades have seen different methods developed to optimize the preparation efficiency of single atoms in optical traps. Here we review the near-deterministic preparation of single atoms based on light-assisted collisions and describe how this method can be implemented in different trap regimes. The simplicity and versatility of the method makes it feasible to be employed in future quantum technologies such as a quantum logic device. Full article
(This article belongs to the Special Issue Quantum Metrology)
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