Special Issue "Precision Measurements and Metrology Using Lasers"

Quicklinks

A special issue of Technologies (ISSN 2227-7080).

Deadline for manuscript submissions: closed (30 April 2014)

Special Issue Editor

Guest Editor
Dr. David Kerr

Wolfson School of Mechanical and Manufacturing Engineering, Loughborough University, Ashby Road, Loughborough Leicestershire, UK
Website | E-Mail
Fax: +44-1509-227648
Interests: optical metrology; fringe analysis; digital image processing; industrial machine vision

Special Issue Information

Dear Colleagues,

Since its inception around 1960, the laser has found myriad applications in science, engineering, and medicine. The use of lasers in metrology includes the precise measurement of distance, velocity, acceleration, torque, strain, surface finish, and shape. For more than 50 years, the unique properties of laser radiation (i.e., coherence, narrow wavelength, low beam divergence and high intensity) have made lasers ideal for accurate and repeatable non-contact measurement. This special issue aims to publish new research and novel applications in all types of laser metrology and precision measurement. It is my pleasure to encourage both theoretical and empirical papers in this ever-expanding and exciting discipline.

Dr. David Kerr
Guest Editor

Submission

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. Papers will be published continuously (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are refereed through a peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Technologies is an international peer-reviewed Open Access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. For the first couple of issues the Article Processing Charge (APC) will be waived for well-prepared manuscripts. English correction and/or formatting fees of 250 CHF (Swiss Francs) will be charged in certain cases for those articles accepted for publication that require extensive additional formatting and/or English corrections.


Keywords

  • laser
  • metrology
  • speckle
  • interferometry
  • coherent
  • measurement
  • quality
  • precision

Published Papers (3 papers)

View options order results:
result details:
Displaying articles 1-3
Export citation of selected articles as:

Research

Jump to: Review

Open AccessArticle A 100-m Fabry–Pérot Cavity with Automatic Alignment Controls for Long-Term Observations of Earth’s Strain
Technologies 2014, 2(3), 129-142; doi:10.3390/technologies2030129
Received: 29 April 2014 / Revised: 27 June 2014 / Accepted: 15 July 2014 / Published: 6 August 2014
Cited by 1 | PDF Full-text (1087 KB) | HTML Full-text | XML Full-text
Abstract
We have developed and built a highly accurate laser strainmeter for geophysical observations. It features the precise length measurement of a 100-m optical cavity with reference to a stable quantum standard. Unlike conventional laser strainmeters based on simple Michelson interferometers that require uninterrupted
[...] Read more.
We have developed and built a highly accurate laser strainmeter for geophysical observations. It features the precise length measurement of a 100-m optical cavity with reference to a stable quantum standard. Unlike conventional laser strainmeters based on simple Michelson interferometers that require uninterrupted fringe counting to track the evolution of ground deformations, this instrument is able to determine the absolute length of a cavity at any given time. The instrument offers advantage in covering a variety of geophysical events, ranging from instantaneous earthquakes to crustal deformations associated with tectonic strain changes that persist over time. An automatic alignment control and an autonomous relocking system have been developed to realize stable performance and maximize observation times. It was installed in a deep underground site at the Kamioka mine in Japan, and an effective resolution of 2 × (10−8 − 10−7) m was achieved. The regular tidal deformations and co-seismic strain changes were in good agreement with those from a theoretical model and a co-located conventional laser strainmeter. Only the new instrument was able to record large strain steps caused by a nearby large earthquake because of its capability of absolute length determination. Full article
(This article belongs to the Special Issue Precision Measurements and Metrology Using Lasers)
Open AccessArticle Crustal Strain Observation Using a Two-Color Interferometer with Accurate Correction of Refractive Index of Air
Technologies 2014, 2(3), 115-128; doi:10.3390/technologies2030115
Received: 30 April 2014 / Revised: 23 June 2014 / Accepted: 24 June 2014 / Published: 4 July 2014
Cited by 1 | PDF Full-text (610 KB) | HTML Full-text | XML Full-text
Abstract
A highly accurate two-color interferometer with automatic correction of the refractive index of air was developed for crustal strain observation. The two-color interferometer, which can measure a geometrical distance of approximately 70 m, with a relative resolution of 2 × 10−9,
[...] Read more.
A highly accurate two-color interferometer with automatic correction of the refractive index of air was developed for crustal strain observation. The two-color interferometer, which can measure a geometrical distance of approximately 70 m, with a relative resolution of 2 × 10−9, clearly detected a change in strain due to earth tides in spite of optical measurement in air. Moreover, a large strain quake due to an earthquake could be observed without disturbing the measurement. We demonstrated the advantages of the two-color interferometer in air for geodetic observation. Full article
(This article belongs to the Special Issue Precision Measurements and Metrology Using Lasers)

Review

Jump to: Research

Open AccessReview Applications of Optical Interferometer Techniques for Precision Measurements of Changes in Temperature, Growth and Refractive Index of Materials
Technologies 2014, 2(2), 54-75; doi:10.3390/technologies2020054
Received: 13 December 2013 / Revised: 16 March 2014 / Accepted: 27 March 2014 / Published: 5 May 2014
Cited by 2 | PDF Full-text (991 KB) | HTML Full-text | XML Full-text
Abstract
Optical metrology techniques used to measure changes in thickness; temperature and refractive index are surveyed. Optical heterodyne detection principle and its applications for precision measurements of changes in thickness and temperature are discussed. Theoretical formulations are developed to estimate crystal growth rate, surface
[...] Read more.
Optical metrology techniques used to measure changes in thickness; temperature and refractive index are surveyed. Optical heterodyne detection principle and its applications for precision measurements of changes in thickness and temperature are discussed. Theoretical formulations are developed to estimate crystal growth rate, surface roughness and laser cooling/heating of solids. Applications of Michelson and Mach-Zehnder interferometers to measure temperature changes in laser heating of solids are described. A Mach-Zehnder interferometer is used to measure refractive index and concentration variations of solutions in crystal growth experiments. Additionally, fluorescence lifetime sensing and fluorescence ratio method are described for temperature measurement. For all the above techniques, uncertainty calculations are included. Full article
(This article belongs to the Special Issue Precision Measurements and Metrology Using Lasers)

Journal Contact

MDPI AG
Technologies Editorial Office
St. Alban-Anlage 66, 4052 Basel, Switzerland
technologies@mdpi.com
Tel. +41 61 683 77 34
Fax: +41 61 302 89 18
Editorial Board
Contact Details Submit to Technologies
Back to Top