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Journal: Materials, 2024
Volume: 17
Number: 4048
Article:
Real-Time Spectroscopic Ellipsometry for Flux Calibrations in Multi-Source Co-Evaporation of Thin Films: Application to Rate Variations in CuInSe2 Deposition
Authors:
by
Dhurba R. Sapkota, Balaji Ramanujam, Puja Pradhan, Mohammed A. Razooqi Alaani, Ambalanath Shan, Michael J. Heben, Sylvain Marsillac, Nikolas J. Podraza and Robert W. Collins
Link:
https://www.mdpi.com/1996-1944/17/16/4048
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