Order Article Reprints

Zhang H, Kang X, Zheng Y, Wei K, Wu H, Liu X, Ye T, Jin Z. Investigation on Capacitance Collapse Induced by Secondary Capture of Acceptor Traps in AlGaN/GaN Lateral Schottky Barrier Diode. Micromachines. 2022; 13(5):748. https://doi.org/10.3390/mi13050748

Zhang, Haitao, Xuanwu Kang, Yingkui Zheng, Ke Wei, Hao Wu, Xinyu Liu, Tianchun Ye, and Zhi Jin. 2022. "Investigation on Capacitance Collapse Induced by Secondary Capture of Acceptor Traps in AlGaN/GaN Lateral Schottky Barrier Diode" Micromachines 13, no. 5: 748. https://doi.org/10.3390/mi13050748

Zhang, H., Kang, X., Zheng, Y., Wei, K., Wu, H., Liu, X., Ye, T., & Jin, Z. (2022). Investigation on Capacitance Collapse Induced by Secondary Capture of Acceptor Traps in AlGaN/GaN Lateral Schottky Barrier Diode. Micromachines, 13(5), 748. https://doi.org/10.3390/mi13050748