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Casu C, Buffolo M, Caria A, De Santi C, Zanoni E, Meneghesso G, Meneghini M. Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting Diode. Micromachines. 2022; 13(8):1266. https://doi.org/10.3390/mi13081266

Casu, Claudia, Matteo Buffolo, Alessandro Caria, Carlo De Santi, Enrico Zanoni, Gaudenzio Meneghesso, and Matteo Meneghini. 2022. "Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting Diode" Micromachines 13, no. 8: 1266. https://doi.org/10.3390/mi13081266

Casu, C., Buffolo, M., Caria, A., De Santi, C., Zanoni, E., Meneghesso, G., & Meneghini, M. (2022). Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting Diode. Micromachines, 13(8), 1266. https://doi.org/10.3390/mi13081266