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Journal: Micromachines, 2022
Volume: 13
Number: 1266

Article: Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting Diode
Authors: by Claudia Casu, Matteo Buffolo, Alessandro Caria, Carlo De Santi, Enrico Zanoni, Gaudenzio Meneghesso and Matteo Meneghini
Link: https://www.mdpi.com/2072-666X/13/8/1266

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