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Micromachines
Volume 15
Issue 2
10.3390/mi15020252
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Journal: Micromachines, 2024
Volume: 15
Number: 252

Article: RC-Effects on the Oxide of SOI MOSFET under Off-State TDDB Degradation: RF Characterization and Modeling
Authors: by Alan Otero-Carrascal, Dora Chaparro-Ortiz, Purushothaman Srinivasan, Oscar Huerta, Edmundo Gutiérrez-Domínguez and Reydezel Torres-Torres
Link: https://www.mdpi.com/2072-666X/15/2/252

MDPI offers high quality article reprints with convenient shipping to destinations worldwide. Each reprint features a 270 gsm bright white cover and 105 gsm premium white paper, bound with two stitches for durability and printed in full color. The cover design is customized to your article and designed to be complimentary to the journal.

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