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Journal: Micromachines, 2024
Volume: 15
Number: 252

Article: RC-Effects on the Oxide of SOI MOSFET under Off-State TDDB Degradation: RF Characterization and Modeling
Authors: by Alan Otero-Carrascal, Dora Chaparro-Ortiz, Purushothaman Srinivasan, Oscar Huerta, Edmundo Gutiérrez-Domínguez and Reydezel Torres-Torres
Link: https://www.mdpi.com/2072-666X/15/2/252

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