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Journal: Appl. Sci., 2021
Volume: 11
Number: 8970

Article: In Situ X-ray Measurements to Follow the Crystallization of BaTiO3 Thin Films during RF-Magnetron Sputter Deposition
Authors: by Peter Walter, Markus Ilchen, JanTorben Roeh, Wiebke Ohm, Christian Bonar Zeuthen and Uwe Klemradt
Link: https://www.mdpi.com/2076-3417/11/19/8970

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